Description
Detailed parameter table
| Parameter name | Parameter value |
| Product model | NI PXIe-5122 |
| Manufacturer | National Instruments (NI) |
| Product category | High-Speed PXI Express (PXIe) Digitizer (Analog Signal Capture) |
| Electrical Performance (Analog Input) | 2 differential / 4 single-ended channels; 12-bit resolution; 1 GS/s max sampling rate per channel (simultaneous); 300 MHz (-3 dB) bandwidth; ±0.5 V/±1 V/±2 V/±5 V software-selectable input ranges |
| Signal Integrity | > 60 dB SNR (100 MHz, ±1 V); > 75 dBc SFDR (100 MHz); < 80 µVrms input-referred noise (±1 V); < -70 dB cross-talk (adjacent channels) |
| Onboard Memory & Capture Modes | 512 MB FIFO per channel (expandable via chassis); Single-shot/continuous/segmented/triggered modes; 100% pre-trigger buffer; 0–10 s programmable post-trigger delay |
| Physical Dimensions | 3U PXIe form factor (160 mm × 100 mm × 22 mm); ~380 g weight; Compatible with NI PXIe-1085/NI PXIe-1095 chassis |
| Interface & Communication | PXIe x4 lane (3.0 compliant, 16 GB/s max transfer); 2× SMA connectors; PXIe trigger bus + TClk; JTAG firmware port; NI-SCOPE driver support (SCPI/LabVIEW/C/C++/Python) |
| Environmental Requirements | 0 °C–55 °C operating temperature; -20 °C–70 °C storage temperature; 10%–90% non-condensing humidity; 2 g vibration (10 Hz–500 Hz); 50 g shock (11 ms half-sine) |
| Power & Compatibility | 15 W typical power (PXIe backplane); Windows 10/11/NI Linux Real-Time support; Works with NI PXIe-8861 (controller) and NI PXIe-5412 (AWG) |
| Triggering Capabilities | Analog (edge/level), digital (PXIe bus), external (SMA) sources; ±1 mV analog trigger sensitivity (±1 V); -100 ms–+10 s trigger delay; 10 ns–10 s trigger holdoff |
| Safety & Compliance | CE/FCC Class A/UL 61010-1/IEC 61010-1; ±15 kV (air)/±8 kV (contact) ESD protection; ±10 V absolute max input overvoltage protection |
NI PXlE-5122
Product introduction
The NI PXIe-5122 is a high-speed PXI Express digitizer from National Instruments (NI), engineered to capture high-frequency, fast-transient analog signals—addressing critical gaps in high-speed test workflows that power-focused tools like the NI PXIe-4143 (high-power SMU) or low-bandwidth DAQ cards cannot fill. As a flagship model in NI’s high-speed digitizer lineup, the NI PXIe-5122 delivers 1 GS/s sampling per channel and 300 MHz bandwidth, making it indispensable for capturing RF chirps, radar returns, and high-speed digital edges.
Unlike standalone oscilloscopes (limited to benchtop use) or general-purpose DAQ cards, the NI PXIe-5122 integrates seamlessly into PXIe systems. Its 512 MB onboard memory per channel and scatter-gather DMA enable uninterrupted capture of large waveform datasets—critical for analyzing intermittent faults or long-duration transients. When paired with a NI PXIe-8861 controller and NI PXIe-5412 AWG, the NI PXIe-5122 synchronizes via TClk to form closed-loop test systems, ensuring precise alignment between stimulus and response. Whether used in aerospace R&D or semiconductor manufacturing, the NI PXIe-5122 provides the speed and precision needed for modern high-frequency testing.
Core advantages and technical highlights
High-Speed Capture for 300 MHz Signals: The NI PXIe-5122’s 1 GS/s sampling rate and 300 MHz bandwidth enable it to capture signals that slower tools miss. For example, in 5G base station testing, the NI PXIe-5122 captures 256 QAM modulated signals (200 MHz bandwidth) at 1 GS/s, resolving subtle amplitude/phase changes to verify 3GPP compliance. Without this speed, aliasing would distort measurements—rendering test results invalid. This capability surpasses the NI PXIe-4143, which focuses on power sourcing rather than high-frequency signal acquisition.
Long-Duration Transient Analysis: With 512 MB onboard memory per channel, the NI PXIe-5122 captures extended transient events. In a power electronics lab, the NI PXIe-5122 monitors DC-DC converter output for voltage spikes, using 100% pre-trigger memory to record 1 ms of waveform before the spike and 4 ms after. This full context helps diagnose root causes, unlike entry-level digitizers (64 MB memory) that truncate critical data. The NI PXIe-4143, lacking dedicated capture memory, cannot replicate this functionality.
PXIe Synchronization for Multi-Instrument Systems: The NI PXIe-5122 supports PXIe triggers and TClk, enabling sub-10 ns alignment with other PXIe instruments. In aerospace avionics testing, the NI PXIe-5122 (capturing 1 GS/s bus signals) synchronizes with a NI PXIe-5412 (generating stimuli) via TClk—ensuring signal alignment for validating response times. This precision is far superior to the NI PXIe-4143’s power-focused timing, making the NI PXIe-5122 essential for multi-instrument test setups.
Efficient DMA Data Streaming: Scatter-gather DMA offloads data transfer from the CPU, letting the NI PXIe-5122 stream 1 GS/s data to storage continuously. In radar testing, the NI PXIe-5122 streams 2 GB/s of IQ data to an SSD, enabling real-time demodulation without bottlenecks. The NI PXIe-4143, limited to 1 kS/s power measurements, cannot handle this throughput—ensuring the NI PXIe-5122 runs 24/7 in automated systems without data loss.
Typical application scenarios
In aerospace radar validation, a defense contractor uses the NI PXIe-5122 to test airborne radar systems. Installed in a NI PXIe-1095 chassis (controlled by a NI PXIe-8861), the NI PXIe-5122 captures 2-channel radar returns (300 MHz bandwidth) at 1 GS/s. Its 512 MB memory stores 512 µs of data per capture, while 1 mV analog triggering isolates targets. Synchronized with a NI PXIe-5412 AWG via TClk, the NI PXIe-5122 ensures time-aligned stimulus/response—enabling ±1 meter target distance accuracy. This precision outperforms standalone oscilloscopes and is impossible with the NI PXIe-4143.
In semiconductor testing, a manufacturer uses the NI PXIe-5122 to characterize 10 Gbps FPGA serial links. The NI PXIe-5122 samples 5 Gbps clock/data signals (200 MHz bandwidth) at 1 GS/s, measuring jitter and signal integrity for PCIe Gen 3 compliance. Its < -70 dB cross-talk prevents channel interference, while DMA streaming logs thousands of eye diagrams for statistical analysis. This automates testing, cutting characterization time by 50% compared to manual oscilloscope use.
NI PXlE-5122
Related model recommendations
NI PXIe-8861: High-performance PXIe controller for the NI PXIe-5122—processes 1 GS/s waveform data and runs real-time analysis (FFT/eye diagrams) for CPU-intensive tasks.
NI PXIe-5412: PXIe AWG complementary to the NI PXIe-5122—generates radar/5G stimuli, forming a closed-loop test system for signal validation.
NI PXIe-4143: High-power SMU that pairs with the NI PXIe-5122—sources power to DUTs (e.g., radar modules) while the NI PXIe-5122 captures high-frequency outputs.
NI PXIe-1095: 18-slot PXIe chassis optimized for the NI PXIe-5122—provides enhanced cooling and x4 lane connectivity for 16 GB/s data transfer.
NI PXIe-6674T: Timing module that enhances NI PXIe-5122 synchronization—distributes 10 MHz/TClk signals across chassis for sub-10 ns multi-channel alignment.
NI-SCOPE Driver: Core software for the NI PXIe-5122—configures sampling/trigger settings and includes FFT/peak detection tools for test development.
NI LabVIEW 2024: Essential programming tool for the NI PXIe-5122—offers pre-built VIs for waveform visualization and transient analysis, reducing development time by 40%.
NI PXIe-5160: Upgrade of the NI PXIe-5122—10 GS/s sampling, 16-bit resolution, 1 GHz bandwidth for mmWave radar/100 Gbps digital testing.
NI PXIe-2597: Multiplexer module for the NI PXIe-5122—switches between 16 input signals sequentially, reducing digitizer count for multi-signal setups.
Installation, commissioning and maintenance instructions
Installation preparation: Power off the PXIe chassis (e.g., NI PXIe-1095) and wear an ESD wristband (±15 kV) to protect the NI PXIe-5122’s analog front-end. Verify the chassis has an x4 lane slot, then gather a Phillips screwdriver and 50 Ω SMA cables (300 MHz rated). Align the NI PXIe-5122 with chassis rails, insert until the PXIe connector seats, and secure with the front-panel screw. Connect SMA cables to the NI PXIe-5122’s inputs and DUT—ensure 50 Ω impedance matching to avoid signal reflection.
Maintenance suggestions: After installation, power on the chassis/PC, install NI-SCOPE/LabVIEW, and use NI MAX to detect the NI PXIe-5122. Run a “Signal Integrity Test” (100 MHz sine wave, ±1 V) to verify SNR/SFDR. Calibrate the NI PXIe-5122 annually with a NIST-traceable generator to maintain performance. Inspect SMA connectors quarterly—clean with 99.9% isopropyl alcohol and a lint-free swab to remove oxidation. If the NI PXIe-5122 captures distorted waveforms, check cables or update firmware via JTAG. Avoid temperatures >55 °C or humidity >90% to protect ADCs and amplifiers.
Service and guarantee commitment
National Instruments (NI) provides a 2-year standard warranty for the NI PXIe-5122, covering defects in its ADC, analog front-end, and PXIe interface—reflecting confidence in its durability for high-frequency use. The NI ServicePlus Premium Plan extends coverage to 5 years, including annual NIST-traceable calibration (SNR/bandwidth), 1-hour priority support (aerospace/telecom customers), and <3-day expedited repairs. Loaner NI PXIe-5122 modules (when available) minimize downtime for critical systems.
NI’s 24/7 technical team offers expertise in optimizing the NI PXIe-5122 for transient capture or noise reduction. Customers access free resources: 5G testing application notes, LabVIEW radar analysis code, and a user community for high-frequency best practices. Out-of-warranty repairs replace aged components (e.g., ADCs) and restore factory performance, ensuring the NI PXIe-5122 meets long-term test demands.
