NI PXIE-1065

High-Speed Data Throughput: The NI PXIe-1065 features a PXIe backplane with 8 GB/s total system bandwidth, ensuring fast data transfer between modules and the controller. Each hybrid slot provides 1 GB/s of dedicated bandwidth (via x1 PXIe lane), which is 10x faster than traditional PXI chassis. This speed is critical for high-throughput applications like real-time signal processing or multi-module test systems, where delays can compromise data accuracy.

Flexible Module Compatibility: Unlike chassis limited to only PXIe modules, the NI PXIe-1065’s 7 hybrid slots work with PXIe, PXI, and CompactPCI modules. For example, users can pair a PXIe data acquisition module (e.g., NI PXIe-4497) with a legacy PXI signal generator in the same NI PXIe-1065 chassis, avoiding the cost of replacing existing hardware. This flexibility makes it a versatile choice for mixed-technology environments.

Reliable Timing and Synchronization: The NI PXIe-1065 includes an integrated 10 MHz reference clock and supports PXIe’s native synchronization buses (Trigger Bus, Star Trigger, Sync Bus). This ensures sub-nanosecond timing alignment across all modules—essential for applications like phase-coherent measurements or multi-channel test setups. For instance, in radar system testing, the NI PXIe-1065 synchronizes multiple receiver modules to capture time-aligned data from different antenna elements, enabling accurate target detection analysis.

Temperature-Controlled Cooling: The chassis uses 3 variable-speed fans with front-to-back airflow, which adjust speed based on internal temperature. This design prevents overheating (a common cause of module failure) while reducing noise during low-load operation. The front-to-back airflow also aligns with data center cooling standards, making the NI PXIe-1065 suitable for rack-mounted industrial systems.

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Description

Detailed Parameter Table

Parameter Name Parameter Value
Product model NI PXIe-1065
Manufacturer National Instruments (NI)
Product category 8-slot PXI Express (PXIe) Chassis
Slot configuration 1 PXIe System Timing Slot (Slot 1) + 7 PXIe Hybrid Slots (Slots 2–8)
Backplane bandwidth Up to 8 GB/s total system bandwidth; 1 GB/s per hybrid slot (x1 PXIe lane)
Timing synchronization Integrated 10 MHz reference clock; supports PXIe Trigger Bus, Star Trigger, and Synchronization (Sync) Bus
Power supply AC input: 100–240 VAC, 50/60 Hz; DC output: +3.3 V (25 A), +5 V (30 A), +12 V (20 A), -12 V (2 A)
Cooling system 3 variable-speed, front-to-back airflow fans (temperature-controlled)
Operating temperature range 0 °C to 55 °C (32 °F to 131 °F)
Storage temperature range -20 °C to 70 °C (-4 °F to 158 °F)
Physical dimensions (W×H×D) 43.2 cm × 13.3 cm × 45.7 cm (17.0 in × 5.25 in × 18.0 in)
Weight Approximately 7.3 kg (16.1 lb)
Compatibility Supports PXIe, PXI, and CompactPCI modules (via hybrid slots)
Compliance standards CE, FCC Class A, UL/cUL 61010-1, IEC 61010-1
NI PXIE-1065

NI PXIE-1065

Product Introduction

The NI PXIe-1065 is a high-performance 8-slot PXI Express chassis developed by National Instruments (NI), serving as the foundational platform for modular test, measurement, and automation systems. As a key member of NI’s PXIe chassis family, it combines flexible slot configuration with robust timing and synchronization capabilities, making it ideal for integrating mixed-signal modules (e.g., data acquisition, signal generation, and control) in industrial and laboratory environments.

At the heart of the NI PXIe-1065 is its hybrid backplane design: 1 dedicated system timing slot (for PXIe controllers) and 7 hybrid slots that support both PXIe and legacy PXI/CompactPCI modules. This backward compatibility protects existing investments while enabling upgrades to high-speed PXIe technology. Paired with NI PXIe controllers (such as the NI PXIe-8880) and application-specific modules, the NI PXIe-1065 delivers a scalable solution—engineers can start with a basic 2-module setup and expand to 8 modules as test requirements grow, eliminating the need for full system overhauls.

Core Advantages and Technical Highlights

High-Speed Data Throughput: The NI PXIe-1065 features a PXIe backplane with 8 GB/s total system bandwidth, ensuring fast data transfer between modules and the controller. Each hybrid slot provides 1 GB/s of dedicated bandwidth (via x1 PXIe lane), which is 10x faster than traditional PXI chassis. This speed is critical for high-throughput applications like real-time signal processing or multi-module test systems, where delays can compromise data accuracy.

Flexible Module Compatibility: Unlike chassis limited to only PXIe modules, the NI PXIe-1065’s 7 hybrid slots work with PXIe, PXI, and CompactPCI modules. For example, users can pair a PXIe data acquisition module (e.g., NI PXIe-4497) with a legacy PXI signal generator in the same NI PXIe-1065 chassis, avoiding the cost of replacing existing hardware. This flexibility makes it a versatile choice for mixed-technology environments.

Reliable Timing and Synchronization: The NI PXIe-1065 includes an integrated 10 MHz reference clock and supports PXIe’s native synchronization buses (Trigger Bus, Star Trigger, Sync Bus). This ensures sub-nanosecond timing alignment across all modules—essential for applications like phase-coherent measurements or multi-channel test setups. For instance, in radar system testing, the NI PXIe-1065 synchronizes multiple receiver modules to capture time-aligned data from different antenna elements, enabling accurate target detection analysis.

Temperature-Controlled Cooling: The chassis uses 3 variable-speed fans with front-to-back airflow, which adjust speed based on internal temperature. This design prevents overheating (a common cause of module failure) while reducing noise during low-load operation. The front-to-back airflow also aligns with data center cooling standards, making the NI PXIe-1065 suitable for rack-mounted industrial systems.

Typical Application Scenarios

The NI PXIe-1065 is widely used in industrial test and automation projects that require modularity and performance. In semiconductor manufacturing, it serves as the core of integrated circuit (IC) test systems: engineers install NI PXIe-1065 in test racks, pairing it with PXIe digital I/O modules (for IC pin stimulation) and PXIe oscilloscope modules (for signal measurement). The chassis’ synchronization capabilities ensure that test signals and measurements are time-aligned, enabling accurate validation of IC performance before shipment.

In automotive electronics testing, the NI PXIe-1065 supports end-of-line (EOL) test stations for components like infotainment systems or ADAS (Advanced Driver Assistance Systems). Technicians connect multiple modules to the NI PXIe-1065—such as a PXIe audio analyzer (for infotainment testing) and a PXI CAN/LIN interface module (for ADAS communication testing). The chassis’ compact size (5.25 in height) allows it to fit in space-constrained production lines, while its high bandwidth handles the large volume of test data generated.

In aerospace and defense, the NI PXIe-1065 is used in avionics test benches to validate flight control systems. It integrates PXIe data acquisition modules (for sensor signal capture) and PXIe communication modules (for simulating aircraft bus protocols like ARINC 429). The NI PXIe-1065’s rugged design (operating temperature 0–55 °C) and reliable cooling ensure consistent performance in harsh lab or field environments, critical for meeting strict aerospace safety standards.

NI PXIE-1065

NI PXIE-1065

Related Model Recommendations

NI PXIe-1075: A 18-slot PXIe chassis, serving as an expansion of the NI PXIe-1065 for large-scale test systems (e.g., multi-channel radar testing) requiring more module slots.

NI PXIe-1062Q: A 6-slot PXIe chassis with 4 hybrid slots and 2 PXIe-only slots, a compact alternative to the NI PXIe-1065 for space-constrained applications (e.g., benchtop testing).

NI PXIe-8880: A high-performance PXIe controller (Intel Core i7) designed to pair with the NI PXIe-1065—provides the processing power for real-time data analysis and system control.

NI PXIe-4497: An 8-channel dynamic signal acquisition (DSA) module, a common companion to the NI PXIe-1065 for vibration or acoustic testing in modular systems.

NI PXI-6259: A legacy PXI data acquisition module, fully compatible with the NI PXIe-1065’s hybrid slots for users transitioning from PXI to PXIe technology.

NI PXIe-1085: A 24-slot PXIe chassis with higher power output (+12 V @ 40 A), an upgrade to the NI PXIe-1065 for power-hungry modules (e.g., high-power signal generators).

NI cDAQ-9178: A CompactDAQ chassis, a portable alternative to the NI PXIe-1065 for field testing—though less powerful, it offers similar modularity for low-bandwidth applications.

NI PXIe-6570: A PXIe digital I/O module, often used with the NI PXIe-1065 in semiconductor or automotive test systems to generate/measure digital signals.

Installation, Commissioning and Maintenance Instructions

Installation preparation: Before installing the NI PXIe-1065, ensure the installation area has adequate ventilation (minimum 10 cm clearance around the chassis) and a stable AC power source (100–240 VAC). For rack mounting, use NI’s optional rack ears (part number 781548-01) and ensure the rack can support the chassis’ 7.3 kg weight. Power off the chassis and all connected modules before installation. Insert modules firmly into the desired slots (aligning with the backplane connector) until the module’s front panel is seated; secure each module with screws to prevent movement. Connect the chassis to a PXIe controller (e.g., NI PXIe-8880) via the system timing slot (Slot 1), then power on the chassis and install the latest NI-DAQmx or NI-VISA drivers for full module compatibility.

Maintenance suggestions: For long-term reliability of the NI PXIe-1065, clean the front air filter monthly with compressed air (or replace it every 6 months, part number 781549-01) to prevent dust buildup, which can block airflow and cause overheating. Inspect the backplane connectors quarterly for corrosion or debris; clean gently with a dry, lint-free swab if needed. If the chassis’ fan warning light illuminates, check for blocked vents or a failed fan—replace faulty fans with NI-approved spares (part number 781550-01) to avoid overheating. Calibrate the chassis’ timing circuits annually using NI’s Calibration Executive software to maintain synchronization accuracy. For persistent issues (e.g., no power, module communication errors), contact NI technical support—do not disassemble the chassis, as this will void the warranty.

Service and Guarantee Commitment

The NI PXIe-1065 comes with a standard 2-year manufacturer’s warranty, covering defects in materials and workmanship. NI guarantees that the NI PXIe-1065 will meet all published technical specifications during the warranty period, with free repair or replacement of defective units. Customers can extend coverage to 5 years by purchasing NI’s Extended Service Program (ESP), which includes priority technical support, expedited repair (24–48 hour turnaround for critical issues), and annual calibration services to maintain performance.

NI provides comprehensive support for the NI PXIe-1065 through global channels: online resources (application notes, video tutorials, and a community forum), email support, and phone access to NI’s team of PXIe experts. For custom integration needs, NI offers professional services—including system design, software development, and on-site training—to help customers optimize their NI PXIe-1065-based test systems. This commitment ensures that users maximize uptime, reduce operational costs, and get the most value from their NI PXIe-1065 investment throughout its lifecycle.