NI PCI-6561

Multi-Protocol Support & Flexible Logic Levels: The NI PCI-6561 supports multiple high-speed logic standards (LVDS, LVPECL, TTL/CMOS) via software configuration, eliminating the need for external signal converters. For instance, when testing a mixed-signal PCB, it can generate LVDS signals (for high-speed data paths) and TTL signals (for control lines) simultaneously—adapting to diverse DUT interfaces without hardware reconfiguration. This flexibility reduces test setup time by 50% compared to single-standard tools.

Ultra-Low Jitter & High Signal Integrity: With signal jitter as low as 50 ps (rms), the NI PCI-6561 generates near-ideal digital waveforms—essential for testing sensitive high-speed components (e.g., 5G RF transceivers and aerospace-grade FPGAs). Its built-in eye diagram analysis tool visualizes signal quality in real time, allowing engineers to quickly identify issues like inter-symbol interference (ISI) or crosstalk. For example, when validating a SerDes link, the NI PCI-6561 measures the eye opening at different voltages and timings to ensure compliance with industry standards (e.g., IEEE 802.3bj for 100 Gbps Ethernet).

Scalable Synchronization & FPGA Programmability: The NI PCI-6561 supports RTSI bus synchronization, enabling multi-card setups (up to 8 cards) with ±10 ps timing alignment—critical for testing multi-lane high-speed interfaces (e.g., 4-lane PCIe Gen 3). Additionally, it integrates an FPGA (Xilinx Kintex-7) that users can program via LabVIEW FPGA to implement custom test logic (e.g., proprietary protocol decoding or real-time BER calculation). This programmability lets the NI PCI-6561 adapt to evolving standards (e.g., from 10 Gbps to 25 Gbps Ethernet) without hardware replacement.

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Description

Detailed parameter table

Parameter name Parameter value
Product model NI PCI-6561
Manufacturer National Instruments (NI)
Product category High-Speed Digital Waveform Generator/Analyzer (PCI Interface)
Electrical performance 4 differential digital channels (8 single-ended); Logic levels: LVDS, LVPECL, TTL/CMOS (software-selectable); Maximum data rate: 1.25 Gbps per channel; Input/output voltage range: ±0.5 V (LVDS), 0–3.3 V (TTL)
Physical size Dimensions (L×W×H): 175 mm × 106 mm × 25 mm (standard PCI form factor, with heatsink); Weight: Approximately 280 g
Interface type PCI 2.3 compliant (32-bit, 33 MHz); 4 SMA connectors (for high-speed differential signals); 10-pin header (for trigger/synchronization); RTSI bus connector (8-line)
Communication protocol PCI bus for data transfer; Compatible with NI-HSDIO driver; Supports DMA (direct memory access) for high-throughput data; Supports SCPI and LabVIEW FPGA programming
Environmental requirements Operating temperature: 0 °C to 55 °C; Storage temperature: -20 °C to 70 °C; Relative humidity: 10% to 90% (non-condensing); Vibration resistance: 1.5 g (10 Hz to 500 Hz); Shock resistance: 30 g (11 ms half-sine)
Installation method Standard PCI slot mounting (compatible with PCI 2.1/2.2/2.3 chassis); Requires dedicated heatsink contact (for thermal management); ESD protection (±15 kV air discharge) during installation
Performance indicators Onboard memory: 256 MB per channel (for waveform storage); Signal jitter: < 50 ps (rms); Eye diagram analysis: Built-in (supports mask testing); Synchronization accuracy: ±10 ps across multiple cards
Power requirements Powered by PCI bus + external 12 VDC power supply (for high-speed circuits); Typical power consumption: 15 W; Peak power consumption: 22 W (during 1.25 Gbps operation)
Compatibility Supported OS: Windows 10/11 (64-bit); Compatible software: NI LabVIEW, LabVIEW FPGA, C/C++, .NET; Works with NI TestStand for test sequence automation
NI PCI-6561

NI PCI-6561

Product introduction

The NI PCI-6561 is a high-speed digital waveform generator/analyzer developed by National Instruments (NI), belonging to NI’s High-Speed Digital (HSD) product series—designed specifically for testing and validating high-speed digital interfaces in industrial automation and aerospace/defense systems. Unlike standard digital I/O cards (e.g., the NI PCI-6541), the NI PCI-6561 integrates dual functionality: it generates precise digital waveforms (up to 1.25 Gbps) for stimulating devices under test (DUTs) and analyzes received signals to verify performance—making it a all-in-one solution for high-speed protocol testing (e.g., PCIe, Ethernet, and SerDes).

In automation systems, the NI PCI-6561 acts as a “digital signal hub” for high-speed component validation. For example, in a data center switch test setup, it generates 10 Gbps Ethernet test frames to stress-test the switch’s ports, then analyzes the switch’s output signals to measure jitter, bit error rate (BER), and signal integrity. Its 256 MB onboard memory per channel stores long-duration test patterns (e.g., 10 million 64-bit data frames), enabling unattended testing—critical for validating the reliability of high-speed digital components in mass production.

Core advantages and technical highlights

Multi-Protocol Support & Flexible Logic Levels: The NI PCI-6561 supports multiple high-speed logic standards (LVDS, LVPECL, TTL/CMOS) via software configuration, eliminating the need for external signal converters. For instance, when testing a mixed-signal PCB, it can generate LVDS signals (for high-speed data paths) and TTL signals (for control lines) simultaneously—adapting to diverse DUT interfaces without hardware reconfiguration. This flexibility reduces test setup time by 50% compared to single-standard tools.

Ultra-Low Jitter & High Signal Integrity: With signal jitter as low as 50 ps (rms), the NI PCI-6561 generates near-ideal digital waveforms—essential for testing sensitive high-speed components (e.g., 5G RF transceivers and aerospace-grade FPGAs). Its built-in eye diagram analysis tool visualizes signal quality in real time, allowing engineers to quickly identify issues like inter-symbol interference (ISI) or crosstalk. For example, when validating a SerDes link, the NI PCI-6561 measures the eye opening at different voltages and timings to ensure compliance with industry standards (e.g., IEEE 802.3bj for 100 Gbps Ethernet).

Scalable Synchronization & FPGA Programmability: The NI PCI-6561 supports RTSI bus synchronization, enabling multi-card setups (up to 8 cards) with ±10 ps timing alignment—critical for testing multi-lane high-speed interfaces (e.g., 4-lane PCIe Gen 3). Additionally, it integrates an FPGA (Xilinx Kintex-7) that users can program via LabVIEW FPGA to implement custom test logic (e.g., proprietary protocol decoding or real-time BER calculation). This programmability lets the NI PCI-6561 adapt to evolving standards (e.g., from 10 Gbps to 25 Gbps Ethernet) without hardware replacement.

Typical application scenarios

In aerospace/defense, the NI PCI-6561 is widely used for testing avionics high-speed data buses (e.g., ARINC 818 and Fibre Channel). For example, in a military aircraft’s mission computer test rig, the NI PCI-6561 generates ARINC 818 video data streams (up to 3 Gbps) to simulate camera inputs, then analyzes the computer’s output signals to verify data integrity—ensuring no frame loss or corruption during flight. Its ultra-low jitter (< 50 ps) mimics real-world avionics signal conditions, while the built-in eye diagram tool validates compliance with strict military standards (e.g., MIL-STD-1553).

In semiconductor manufacturing, the NI PCI-6561 validates high-speed I/O ports on advanced microchips (e.g., AI accelerators with PCIe Gen 4 interfaces). It generates PCIe test packets (up to 8 Gbps) to stress the chip’s I/O circuits, then measures BER and jitter to quantify performance. The NI PCI-6561’s 256 MB onboard memory stores complex test patterns (e.g., worst-case traffic scenarios), enabling 24/7 unattended testing of 1,000+ chips per day—helping semiconductor fabs reduce test costs by 30% compared to manual testing.

NI PCI-6561

NI PCI-6561

Related model recommendations

NI PCI-6562: A sibling model of the NI PCI-6561 with 8 differential channels (16 single-ended) and the same 1.25 Gbps data rate. It is ideal for testing multi-lane interfaces (e.g., 8-lane PCIe) where more channels are needed than the NI PCI-6561’s 4 channels.

NI PCI-6541: A standard high-speed digital I/O card complementary to the NI PCI-6561. The NI PCI-6561 handles high-speed waveform generation/analysis, while the NI PCI-6541 manages low-speed control signals (e.g., power-on reset and status monitoring) in mixed-speed test setups.

NI PXIe-6591: A PXI Express upgrade of the NI PCI-6561, offering 2.5 Gbps data rate and PCIe x4 transfer. It is suitable for modular test systems (e.g., ATE racks) where faster data transfer and higher channel density are required.

NI PCIe-6592: A PCI Express version of the NI PCI-6561 with 4 channels and 1.25 Gbps speed. It replaces the legacy PCI interface with PCIe x1, improving data transfer latency—ideal for modern PCs without PCI slots.

NI 9250: A CompactDAQ module that pairs with the NI PCI-6561 for distributed testing. The NI 9250 collects analog sensor data (e.g., temperature and voltage) from the DUT, while the NI PCI-6561 tests digital interfaces—providing a comprehensive test solution.

NI LabVIEW FPGA 2024: Essential software for the NI PCI-6561, enabling FPGA programming to implement custom test logic (e.g., proprietary protocol encoding/decoding). It integrates with the NI PCI-6561’s hardware to extend its functionality beyond standard waveform testing.

Installation, commissioning and maintenance instructions

Installation preparation: Before installing the NI PCI-6561, power off the industrial PC and confirm an empty PCI 2.1/2.2/2.3 slot with adjacent space for the heatsink. Wear an ESD wristband (rated ±15 kV) and use a grounded workbench to avoid damaging the card’s high-speed circuits. Connect the external 12 VDC power supply (provided by NI) to the card’s power connector—ensure the voltage polarity is correct (reverse polarity may damage components). Insert the NI PCI-6561 into the PCI slot until fully seated, then secure it with a chassis screw. Connect SMA cables (50 Ω impedance-matched) to the signal ports—use shielded cables to minimize EMI interference. Download and install the latest NI-HSDIO driver and LabVIEW FPGA, then use NI Measurement & Automation Explorer (MAX) to detect the NI PCI-6561 and run a self-test (includes jitter measurement and waveform generation verification).

Maintenance suggestions: Inspect the NI PCI-6561’s SMA connectors and heatsink monthly—clean SMA contacts with isopropyl alcohol (99.9% purity) and a lint-free cloth to remove oxidation, and ensure the heatsink is free of dust (use compressed air to clean). Calibrate the card annually using NI’s calibration kit (e.g., NI 9189) to maintain jitter accuracy and signal level precision. If the NI PCI-6561 fails to generate/analyze signals, check the external power supply (ensure 12 VDC ±5% stability) and reinstall the NI-HSDIO driver. Replace the card’s thermal paste (on the heatsink) every 2 years to maintain thermal performance—use NI-approved thermal compound (thermal conductivity ≥ 4 W/mK) to prevent overheating. Avoid exposing the NI PCI-6561 to temperatures above 55 °C or humidity above 90% to prevent degradation of high-speed components.

Service and guarantee commitment

National Instruments (NI) provides a 3-year standard warranty for the NI PCI-6561, covering defects in materials and workmanship—longer than the industry average for high-speed test equipment. For extended protection, customers can purchase the ServicePlus Premium plan, which extends coverage to 7 years and includes annual factory calibration (traceable to NIST/ISO standards), priority technical support (2-hour response time for critical issues), and expedited repairs (turnaround time < 2 business days).

NI’s global technical team (specialized in high-speed digital testing) is available 24/7 via email, online chat, and phone to assist with the NI PCI-6561’s FPGA programming, protocol configuration, and signal integrity troubleshooting. Customers also have free access to exclusive resources: application notes on SerDes testing, LabVIEW FPGA example code for the NI PCI-6561, and a user community where engineers share high-speed test best practices. For out-of-warranty repairs, NI offers a flat-rate service that restores the NI PCI-6561 to factory specifications—including replacing aged high-speed components (e.g., clock generators) and verifying jitter performance (< 50 ps). This commitment reflects NI’s confidence in the NI PCI-6561’s durability and its dedication to supporting customers’ long-term high-speed test needs.