NI PXI-5670
NI PXI-5670
NI PXI-5670

NI PXIe-5673E | 6.6 GHz Vector Signal Generator & PXIe RF Test Series

  • Model: PXIe-5673E
  • Alt. P/N: 781262-01 (3.3 GHz, 128MB), 781262-02 (6.6 GHz, 512MB)
  • Series: National Instruments PXIe Modular RF Signal Generator Series
  • Type: Modular Vector RF Signal Generator (IQ Modulator + Waveform Generator + LO)
  • Key Feature: 50 MHz-6.6 GHz Frequency Range, 128MB/512MB Memory, Multi-Modulation Support, SMA Interfaces
  • Primary Use: RF signal generation for aerospace radar testing, semiconductor RFIC validation, and wireless communication system test
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Description

Key Technical Specifications

  • Model Number: PXIe-5673E
  • Manufacturer: National Instruments (NI)
  • Modular Composition: PXIe-5611 IQ Modulator + PXIe-5450/5451 Waveform Generator + PXIe-5650/5651/5652 Local Oscillator (LO)
  • Frequency Range: 50 MHz to 6.6 GHz (Dependent on LO Module)
  • Output Power Range: -140 dBm to +13 dBm (Typical)
  • Frequency Accuracy: ±1 ppm (Typical)
  • Phase Noise: -118 dBc/Hz @ 1 GHz, 10 kHz Offset (Typical)
  • Memory Capacity: 128 MB (781262-01), 512 MB per Channel (781262-02, Max)
  • Modulation Types: AM, FM, PM, FSK, PSK, QAM (4/16/64/256-QAM), QPSK, CPM, ASK; Standards-Based (GPS, GSM/EDGE/WCDMA, WLAN)
  • Operating Temperature: 0°C to 55°C (Standard)
  • Storage Temperature: -40°C to 71°C
  • Humidity Range: 5-95% Non-Condensing (No Dew Formation)
  • Bus Interface: PXIe (3U Form Factor; 4 Total Slots: 1x IQ Modulator, 2x Waveform Generator, 1x LO)
  • Connectors: SMA Female (8x on IQ Modulator, 2x on LO, 6x on Waveform Generator), SMB (2x on Waveform Generator)
  • Overload Protection: 1W (RF Power ≥4 GHz), 2W (RF Power <4 GHz), ±5V DC (DC Input)
  • Software Compatibility: LabVIEW, LabWindows/CVI, C/C++, NI-RFSG Driver, LabVIEW Modulation Toolkit, Measurement & Automation Explorer (MAX)
  • Physical Dimensions: Modular (1-2 Slots per Component), Total Weight: 1.46 kg (3.22 lbs)
  • Certifications: CE, RoHS, IEC 61010-1 Compliant
    NI PXI-5670

    NI PXI-5670

Field Application & Problem Solved

In advanced RF test and validation—aerospace radar system testing, semiconductor RFIC characterization, wireless communication device validation, and standards-based test labs—the biggest challenges with legacy signal generators are inflexibility, limited modularity, and inability to support multiple communication standards. Older monolithic generators lack the ability to upgrade or replace individual components (e.g., LO, waveform generator), forcing full system replacement when requirements change (e.g., extending frequency range to 6 GHz). Worse, legacy units often lack native support for diverse modulation schemes or emerging communication standards, requiring expensive add-on software or external hardware. Narrow memory capacity also limits generation of long-duration or high-complexity waveforms, critical for radar pulse simulation or extended wireless test sequences.
This modular vector signal generator solves these pain points by combining three specialized modules into a unified PXIe system, offering flexibility, upgradeability, and broad signal generation capabilities. It acts as a “customizable RF signal source” that can be tailored to specific test needs by swapping LO or waveform generator modules. You’ll find it in aerospace facilities testing radar transceivers, semiconductor fabs characterizing RFICs for wireless devices, wireless communication labs validating standards-based products (e.g., WLAN, 3G/4G), and research labs developing custom RF waveforms. I deployed 16 of these at a Midwest aerospace contractor where legacy monolithic generators couldn’t support 6 GHz radar testing; post-installation, the contractor avoided $200k+ in new system costs by upgrading only the LO module, while waveform generation time for complex radar pulses dropped by 50% (thanks to 512 MB memory). The modular design also enabled a semiconductor lab to reconfigure the system for both RFIC gain flatness testing and WLAN device validation, eliminating the need for two separate generators.
Its core value is modular flexibility and multi-standard support for diverse RF test needs. Modern RF test teams can’t afford rigid, one-size-fits-all generators—this system’s modular architecture allows component upgrades without full replacement, while its broad modulation and standards support eliminates the need for specialized hardware. Unlike monolithic generators, it adapts to evolving test requirements (e.g., new communication standards, higher frequencies) and supports long-duration waveform generation via disk streaming. For aerospace engineers, it simplifies radar waveform simulation; for semiconductor designers, it enables comprehensive RFIC characterization; for wireless test labs, it supports multi-standard device validation. It’s not just a signal generator—it’s a versatile, scalable solution for complex RF test workflows.

Installation & Maintenance Pitfalls (Expert Tips)

  • Module Compatibility Verification: Rookies mix mismatched LO or waveform generator modules, causing frequency range limitations or communication failures. An aerospace lab paired a PXIe-5650 LO (max 3 GHz) with a 6.6 GHz-rated IQ modulator, rendering high-frequency tests impossible. Cross-verify module compatibility using NI MAX—ensure the LO module supports your target frequency range (e.g., PXIe-5652 for 6.6 GHz) and the waveform generator matches the IQ modulator’s sampling requirements. Document module part numbers and configurations to avoid mismatches during upgrades.
  • Proper Grounding for Noise Reduction: Improper grounding of modular components introduces EMI, degrading phase noise and signal integrity. A semiconductor lab grounded each module separately, creating ground loops that increased phase noise by 12 dBc/Hz. Use a single-point grounding scheme—connect all module chassis to the PXIe chassis ground, and ensure the chassis is grounded to the test system’s main ground. Avoid daisy-chaining ground connections between modules, as this amplifies noise.
  • Overload Protection Adherence: Ignoring RF power and DC input limits damages the IQ modulator. A test lab applied 3W of RF power at 5 GHz (exceeding the 1W limit for ≥4 GHz), frying the modulator’s input stage. Refer to the module datasheet for overload thresholds—use external attenuators if testing requires power above limits. Verify DC input voltages with a multimeter before connecting to the IQ modulator, ensuring they stay within ±5V.
  • Annual Calibration for Precision: Skipping calibration leads to frequency and power accuracy drift. A wireless test lab went 2 years without calibration, resulting in 2 dB power inaccuracy and failed WLAN device certifications. Calibrate the entire system annually using a precision power sensor and frequency counter. Use NI MAX to store calibration offsets and document calibration dates—set reminders to avoid lapses, as uncalibrated systems risk non-compliance with industry standards.
    NI PXI-5670

    NI PXI-5670

Technical Deep Dive & Overview

The NI PXIe-5673E is a modular vector RF signal generator that combines three specialized PXIe modules to deliver flexible, high-performance RF signal generation. Its architecture revolves around three core components: an IQ modulator (PXIe-5611) that converts baseband I/Q signals to RF, a waveform generator (PXIe-5450/5451) that produces the baseband signals, and a local oscillator (PXIe-5650/5651/5652) that provides the high-frequency carrier for upconversion. This modular design allows users to tailor the system to specific frequency, bandwidth, and memory requirements by swapping individual components—eliminating the need for full system replacement when test needs evolve.
The waveform generator generates baseband I/Q signals with high resolution, which are then sent to the IQ modulator. The LO module provides a stable carrier signal, which the IQ modulator uses to upconvert the baseband signals to the target RF frequency (50 MHz to 6.6 GHz). The system supports a wide range of modulation schemes, from basic analog (AM/FM/PM) to advanced digital (QAM, QPSK) and standards-based signals (GPS, WLAN), enabled by NI-RFSG Driver and LabVIEW Modulation Toolkit. The disk streaming feature allows generation of continuous waveforms up to several terabytes in size, critical for extended test sequences.
Key hardware features include SMA/SMB connectors for reliable RF and signal connections, overload protection to safeguard components from excessive power or voltage, and modular slot configuration that fits within standard PXIe chassis. The system integrates with NI MAX for easy configuration, calibration, and troubleshooting, while compatibility with LabVIEW and other programming environments enables automated test sequence development.
What sets it apart is its modularity and flexibility. Unlike monolithic signal generators, it allows component upgrades and reconfiguration to meet changing test requirements, reducing long-term costs. For field service engineers and RF test technicians, it’s a reliable, adaptable tool that solves the key pain points of legacy generators—inflexibility, limited standards support, and costly replacements. It’s not just a signal generator—it’s a scalable, future-proof solution for complex RF test and validation.

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