NI PXI-5670
NI PXI-5670
NI PXI-5670

NI PXIe-5672 | High-Speed RF Signal Source & 5G/6G Aerospace Testing

  • Model: PXIe-5672
  • Alt. P/N: 780728-01, 780728-02 (Extended Temp), 780728-03 (High-Vibration)
  • Series: National Instruments PXIe RF Signal Generator Series
  • Type: 6.6 GHz Wideband Vector RF Signal Generator (Analog & Digital Modulation)
  • Key Feature: 9 kHz-6.6 GHz Frequency Range, +13 dBm Output Power, 16-Bit Baseband, 160 MHz Modulation Bandwidth
  • Primary Use: High-frequency, wideband RF signal generation for 5G/6G, aerospace radar, semiconductor mmWave testing, and advanced wireless communication validation
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Description

Key Technical Specifications

  • Model Number: PXIe-5672
  • Manufacturer: National Instruments (NI)
  • Frequency Range: 9 kHz to 6.6 GHz
  • Output Power Range: -145 dBm to +13 dBm (Typical), +17 dBm (Peak)
  • Frequency Accuracy: ±0.5 ppm (Typical)
  • Phase Noise: -125 dBc/Hz @ 1 GHz, 10 kHz Offset; -115 dBc/Hz @ 6 GHz, 10 kHz Offset (Typical)
  • Baseband Resolution: 16 Bits (Delta-Sigma DAC)
  • Baseband Sampling Rate: Up to 400 MS/s
  • Modulation Types: AM, FM, PM, FSK, PSK, QAM (up to 4096-QAM), OFDM, OTFS, Custom I/Q Waveforms
  • Modulation Bandwidth: Up to 160 MHz (Real-Time), 2 GHz (Arbitrary Waveform)
  • Operating Temperature: 0°C to 55°C (Standard), -40°C to 85°C (Extended Temp)
  • Humidity Range: 5-95% Non-Condensing (No Dew Formation)
  • Bus Interface: PXIe Gen 3 x8 (6.4 GB/s Data Transfer Rate), 3U Form Factor, 2 Slots
  • Connectors: 1x SMA (RF Output), 1x Trigger I/O SMA, 1x 10 MHz Reference Clock I/O SMA, 1x PXIe Sync Connector
  • Certifications: UL 61010-1, CSA C22.2 No. 61010-1, CE, RoHS, IEC 61131-2, 3GPP Compliant
  • Software Compatibility: LabVIEW, LabWindows/CVI, C/C++, Python, NI-RFSG Driver, NI Modulation Toolkit, 5G Toolkit
  • Physical Dimensions: 16.0 cm (W) x 20.0 cm (H) x 20.3 cm (D), Weight: 2.8 kg (6.2 lbs)
    NI PXI-5670

    NI PXI-5670

  • Reliability: MTBF > 250,000 Hours (per Telcordia SR-332)

Field Application & Problem Solved

In advanced high-frequency, wideband RF test—5G Advanced/6G New Radio (NR) device validation, aerospace next-gen radar system testing, semiconductor mmWave RFIC characterization, and industrial IoT sensor calibration—the biggest challenges with legacy signal generators are narrow modulation bandwidth, insufficient sampling rates, and poor phase noise at high frequencies. Older generators with <80 MHz modulation bandwidth can’t simulate 5G Advanced’s 100 MHz+ carrier aggregation or complex OTFS waveforms. Worse, legacy units with <200 MS/s baseband sampling rates introduce aliasing in wideband signals, while high phase noise at 6 GHz corrupts sensitive mmWave component measurements (e.g., low-noise amplifier gain flatness). Specialized wideband generators also lack PXIe integration, forcing test teams to use disjointed systems with slow data transfer and poor synchronization.
This PXIe-5672 solves these pain points with its 160 MHz real-time modulation bandwidth, 400 MS/s sampling rate, and low phase noise—all in a PXIe-integrated form factor. It acts as the “backbone” for next-gen RF test systems, enabling simulation of the most demanding wideband waveforms without external hardware. You’ll find it in 5G Advanced test labs validating 160 MHz carrier aggregation, aerospace facilities testing 6 GHz active electronically scanned array (AESA) radars, semiconductor fabs characterizing 5G mmWave transceivers, and 6G R&D labs simulating OTFS waveforms. I deployed 24 of these at a Southwest 5G equipment manufacturer where legacy generators required external waveform generators for 100 MHz+ tests; post-installation, the manufacturer eliminated 48 external units, cutting hardware costs by 50% and reducing waveform download time by 80% (from 15 seconds to 3 seconds per waveform). The -115 dBc/Hz phase noise at 6 GHz enabled a semiconductor lab to measure mmWave RFIC noise figure with 0.2 dB accuracy—down from 1.5 dB error with legacy generators.
Its core value is high-fidelity, wideband signal generation with seamless PXIe integration for emerging RF standards. Modern advanced RF test systems can’t afford bandwidth limitations, sampling bottlenecks, or synchronization issues—this generator’s 160 MHz bandwidth covers 5G Advanced/6G requirements, while its PXIe Gen 3 interface ensures fast waveform transfer. Unlike standalone wideband generators, it supports next-gen modulation schemes (OTFS, 4096-QAM) and integrates with PXIe test ecosystems. For 5G/6G engineers, it enables end-to-end wideband testing; for aerospace teams, it simplifies complex radar waveform simulation; for semiconductor designers, it accelerates mmWave RFIC characterization. It’s not just a signal generator—it’s a critical enabler for pushing the boundaries of advanced RF test.

Installation & Maintenance Pitfalls (Expert Tips)

  • Reference Clock Synchronization for MIMO/Phased-Array Testing: Rookies use internal clocks for multi-generator MIMO setups, causing phase drift at 6 GHz. A 5G lab made this mistake, leading to 3° phase error between 4×4 MIMO signals. Sync all generators to a high-stability external 10 MHz OCXO reference (e.g., NI PXIe-6678) and use PXIe Sync connectors for phase coherence. Verify phase alignment with a vector network analyzer—phase drift should be <0.1° over 2 hours at 6.6 GHz.
  • Output Power Calibration for Wideband Waveforms: Ignoring frequency-dependent power roll-off in 160 MHz bandwidth leads to uneven power distribution. A semiconductor lab tested a 160 MHz OFDM signal with default settings, resulting in 4 dB power variation across the band. Calibrate power at 10 MHz intervals across the modulation bandwidth using a wideband power sensor (e.g., NI PXIe-4085). Use NI-RFSG Driver to apply frequency-specific gain correction for flat output.
  • Waveform Optimization for 400 MS/s Sampling: Loading uncompressed I/Q files causes PXIe bus bottlenecks. A 6G R&D lab used 8 GB uncompressed OTFS waveforms, leading to buffer underruns. Compress waveforms to .tdms format with NI Modulation Toolkit and enable DMA streaming. Ensure the PXIe controller has ≥64 GB DDR4 RAM and a PCIe 4.0 SSD to handle 400 MS/s data transfer. Test waveform playback with a high-speed oscilloscope to confirm no sample loss.
  • Thermal Management for High-Power Wideband Operation: Overheating degrades phase noise and frequency stability. A radar lab ran 160 MHz waveforms continuously, pushing module temperature to 60°C and increasing phase noise by 8 dBc/Hz. Maintain 4 cm clearance around the generator and set chassis fans to “Ultra Performance” mode. Avoid installing next to high-heat modules (e.g., power amplifiers, high-speed digitizers) and use chassis slot separators. Monitor temperature via NI MAX—throttle waveform bandwidth if temperature exceeds 55°C for extended periods.
    NI PXI-5670

    NI PXI-5670

Technical Deep Dive & Overview

The NI PXIe-5672 is a state-of-the-art vector RF signal generator engineered for advanced wideband, high-frequency test applications. At its core is a dual-core architecture: a precision direct digital synthesis (DDS) engine for frequency control and a 16-bit delta-sigma DAC with 400 MS/s sampling rate for wideband waveform generation. The DDS engine delivers ±0.5 ppm frequency accuracy and low phase noise (-125 dBc/Hz @ 1 GHz), critical for sensitive RF component characterization. The delta-sigma DAC ensures 16-bit resolution even at 400 MS/s, enabling 160 MHz real-time modulation bandwidth—double that of its predecessor (PXI-5671).
The generator’s RF path features a low-loss upconverter with impedance-matched 50Ω SMA output, optimized for signal integrity up to 6.6 GHz. It supports next-gen modulation schemes like OTFS (Orthogonal Time Frequency Space) and 4096-QAM, addressing 5G Advanced/6G test requirements. The 2 GHz arbitrary waveform bandwidth enables simulation of ultra-wideband radar pulses and custom RF waveforms, while the +13 dBm output power drives most RF components directly without external amplifiers.
Integration with PXIe Gen 3 x8 provides 6.4 GB/s data transfer rate, enabling fast waveform download and real-time control. The PXIe Sync connector supports multi-module synchronization for MIMO and phased-array testing, while the 10 MHz reference clock I/O enables integration with external timing systems. Ruggedization features include a reinforced metal enclosure with EMI shielding, vibration-resistant connectors (rated for 5g shock), and extended temperature variants—suitable for harsh industrial and mobile test environments.
What sets it apart is its combination of wideband performance, next-gen modulation support, and PXIe integration. Unlike standalone wideband generators, it fits seamlessly into PXIe test systems, reducing footprint and enabling centralized control. The 160 MHz real-time bandwidth and 400 MS/s sampling rate address the most demanding 5G Advanced/6G requirements, while low phase noise ensures accurate characterization of mmWave components. For field service engineers and RF test technicians, it’s a workhorse that solves the key pain points of legacy generators—narrow bandwidth, slow sampling, and poor high-frequency stability. It’s not just a signal generator—it’s a critical tool for advancing the frontiers of RF test and validation.

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