Description
NI PXIe-4144 Product Description
Detailed parameter table
Parameter name | Parameter value |
Product model | PXIe-4144 |
Manufacturer | National Instruments |
Product category | PXI Express source measure unit (SMU) |
Channels | 4 independent, isolated channels |
Voltage range | ±20 V, 0-20 V |
Current range | ±1 A, 0-1 A |
Power output | 20 W per channel (maximum) |
Resolution | 18-bit (voltage and current) |
Measurement accuracy | ±0.015% of reading (voltage); ±0.025% of reading (current) |
Sourcing accuracy | ±0.01% of setting (voltage); ±0.02% of setting (current) |
Interface | PXI Express (x1 Gen 2) |
Connector type | 4 BNC (per channel), 1 26-pin D-sub (digital I/O) |
Operating temperature | 0 °C to 55 °C |
Storage temperature | -40 °C to 70 °C |
Physical dimensions | 6.3 x 3.9 inches (160 x 100 mm) |
Power consumption | 120 W (maximum) |
Compliance standards | CE, UL, CSA, FCC Part 15 Class A |
NI PXIE-4144
Product introduction
The National Instruments PXIe-4144 is a high-performance 4-channel source measure unit (SMU) designed for PXI Express systems, combining precise voltage/current sourcing with simultaneous measurement capabilities. As part of NI’s PXIe SMU family, it delivers exceptional accuracy and flexibility for characterizing electronic components, materials, and devices in research, development, and production environments.
The PXIe-4144 integrates seamlessly into automated test systems, leveraging the PXIe backplane for high-speed data transfer and synchronization with other instruments like oscilloscopes and digital multimeters. Each of its four isolated channels can source and measure both voltage (±20 V) and current (±1 A), making it ideal for testing semiconductors, sensors, and passive components. With 18-bit resolution and sub-millisecond response times, the PXIe-4144 balances speed and precision, enabling efficient parametric testing without compromising data quality.
Core advantages and technical highlights
Multi-channel isolation
Each channel of the NI PXIe-4144 features independent isolation, preventing cross-talk between channels and ensuring accurate measurements even when testing devices with different ground potentials. This is critical for characterizing arrays of sensors or semiconductor wafers, where channel-to-channel interference could skew results. Isolation also enhances safety when testing high-voltage components, protecting both the instrument and the operator.
High precision with speed
The PXIe-4144 delivers 18-bit resolution across its full range, enabling detection of minute current variations (down to pA levels) and precise voltage adjustments (µV increments). Despite this precision, it maintains fast response times—sourcing transient signals in under 1 ms—making it suitable for dynamic tests like IV curve tracing or power transient analysis. This balance of speed and accuracy reduces test times in high-volume production while preserving measurement integrity.
Flexible operation modes
The PXIe-4144 supports four primary operation modes: voltage source/current measure, current source/voltage measure, resistance measurement, and pulse generation. This versatility eliminates the need for multiple instruments in mixed-signal test setups. For example, it can source a constant voltage to a diode while measuring leakage current, then switch to current sourcing to characterize a transistor’s gain—all without reconfiguring hardware.
Advanced synchronization
Leveraging PXIe trigger lines and the NI-Sync protocol, the PXIe-4144 synchronizes with other PXIe instruments to within 10 ns. This capability is essential for multi-channel parametric testing, where coordinated sourcing across multiple SMUs ensures accurate timing for devices like power management ICs or multi-pin integrated circuits. The module also supports hardware-based sequencing, allowing pre-programmed test routines to run without software latency.
Typical application scenarios
In semiconductor testing, the NI PXIe-4144 characterizes discrete components like MOSFETs and diodes by generating IV curves. Its four channels can test multiple devices simultaneously, measuring parameters such as breakdown voltage, on-resistance, and leakage current. The module’s fast sourcing speed reduces test time per device, making it suitable for high-volume production lines.
In sensor calibration, the PXIe-4144 provides precise excitation (voltage or current) to sensors while measuring their output signals. For example, it can source 5 V to a pressure transducer and measure the resulting current, then use that data to calibrate the sensor’s response. Its isolation ensures accurate measurements even when sensors are placed in electrically noisy environments, such as industrial machinery.
In materials research, the PXIe-4144 characterizes electrical properties of conductive materials, measuring resistivity by sourcing a known current and recording voltage drop. Its high resolution enables detection of subtle changes in material conductivity due to temperature or stress, supporting studies on thermoelectric materials or corrosion effects.
NI PXIE-4144NI PXIE-4144
Related model recommendations
PXIe-4135: A single-channel SMU with higher current capability (±10 A) that complements the PXIe-4144 in applications requiring high-power testing, such as battery cells or power transistors.
PXIe-5122: A 12-bit, 1 GS/s oscilloscope that pairs with the PXIe-4144 to capture transient voltage/current waveforms during dynamic tests, providing visual confirmation of signal integrity.
PXIe-2597: A high-density switch matrix that integrates with the PXIe-4144 to expand channel count, enabling parallel testing of multiple devices under test (DUTs) in production environments.
PXIe-1085: An 18-slot PXIe chassis that houses the PXIe-4144 and other instruments, providing sufficient power and backplane bandwidth for large-scale test systems.
LabVIEW TestStand: Test management software that automates the PXIe-4144, enabling sequence-based testing with data logging and pass/fail analysis for streamlined production testing.
Installation, commissioning and maintenance instructions
Installation preparation
Before installing the NI PXIe-4144, ensure the PXIe chassis is powered off and properly grounded. Use an anti-static wristband to handle the module, avoiding contact with exposed circuitry. Verify the chassis has an available x1 Gen 2 slot and can supply sufficient power (120 W). Prepare BNC cables rated for ≥20 V and 1 A, and inspect connectors for damage. Mount the module in the chassis, securing it with front-panel screws, then connect BNC cables to the DUTs. Install NI-DCPower driver software and calibrate the module using NI’s calibration utility before first use.
Maintenance suggestions
Inspect BNC connectors monthly for corrosion or bent pins; clean with isopropyl alcohol and a soft cloth if needed. Calibrate the PXIe-4144 annually using NI’s traceable calibration standards to maintain accuracy—this is critical for meeting ISO or FDA requirements in regulated industries. Monitor channel performance via NI’s InstrumentStudio software, checking for drift or increased noise, which may indicate worn relays. Avoid exceeding maximum voltage/current ratings to prevent internal damage. For long-term storage, power the module for 30 minutes every 6 months to stabilize components, and store in a dry environment with temperature between -40 °C and 70 °C.
Service and guarantee commitment
The NI PXIe-4144 is backed by a 3-year standard warranty, covering defects in materials and workmanship. NI’s global technical support team provides 24/7 assistance for installation, programming, and troubleshooting via phone, email, and online resources, including application notes and example code.
NI offers ISO 17025-accredited calibration services, ensuring measurements remain traceable to international standards. For custom test requirements, NI’s professional services team can develop tailored software drivers or test sequences to optimize the PXIe-4144 for specific applications. With a mean time between failures (MTBF) exceeding 100,000 hours, the PXIe-4144 is designed for reliable operation in demanding test environments, backed by NI’s commitment to long-term product support.