NI PXIe-1062Q | 8-Slot High-Bandwidth PXI Express Chassis for Test & Measurement

  • Model: PXIe-1062Q
  • Series: National Instruments PXI Express Chassis Series
  • Type: 8-slot PXI Express Test Chassis
  • Key Feature: 8-slot design (4 PXI slots, 1 PXIe system timing slot, 2 PXIe hybrid slots), up to 1GB/s per-slot bandwidth, 354W available power, dual reference clocks, 43.6dBA low noise operation
  • Primary Use: Used as the core chassis of test systems in electronic manufacturing testing, laboratory precision measurement, industrial process monitoring and other fields, to carry PXI and PXIe modules for high-speed signal acquisition, data processing and equipment control
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Part number: NI PXIe-1062Q
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Description

Key Technical Specifications

Technical Item Details
Manufacturer National Instruments (NI)
Slot Configuration Total 8 slots, including 4 PXI peripheral slots, 1 PXI Express system timing slot, and 2 PXI Express hybrid slots (compatible with both PXI and PXIe modules)
Bandwidth Performance Up to 1GB/s dedicated bandwidth per slot, and the total system bandwidth exceeds 3GB/s to meet high-throughput data transmission needs
Power Supply Parameters 354W available power when working at 0 – 55°C; AC input range is 100 – 240VAC, operating voltage range expands to 90 – 264VAC, input frequency is 50/60Hz
Current Capacity DC output current includes +3.3V (32A), +5V (30A), +12V (25A), -12V (1.5A), 5V auxiliary (2A); the maximum power consumption of the system slot does not exceed 140W, and that of the peripheral slot does not exceed 38.25W
Timing Function Built-in 10MHz reference clock, PXI trigger bus and PXI star trigger for PXI modules; equipped with 100MHz reference clock, Sync 100 and PXI differential star trigger for PXIe modules
Noise & Cooling Acoustical noise as low as 43.6dBA when working at 0 – 30°C; adopts forced air circulation cooling with two 110cfm fans, and has high/auto speed selection function, which can adjust fan speed according to intake air temperature
Protection Functions All DC outputs have short-circuit and overload protection with automatic recovery; +3.3V and +5V outputs have over-voltage protection, which is clamped at 20 – 30% higher than the rated voltage
Operating Temperature 0°C – 55°C
Module Compatibility Compatible with PXI, PXI Express, CompactPCI and CompactPCI Express peripheral modules
Power Supply Design Modular power supply shuttle design, which can be replaced in less than 5 minutes, reducing downtime caused by power supply failures; supports remote power monitoring and inhibition through the rear-panel connector
NI PXIe-1062Q

NI PXIe-1062Q

Field Application & Problem Solved

In high-performance test scenarios such as electronic component testing and precision signal analysis, test systems often need to integrate multiple types of modules such as signal generators, oscilloscope modules, and data acquisition cards. The problems faced here include incompatible module interfaces, insufficient transmission bandwidth leading to data loss, and unstable power supply affecting measurement accuracy.
The NI PXIe-1062Q solves these problems effectively. Its hybrid slot design allows simultaneous use of old PXI modules and new PXIe modules, avoiding the waste of existing PXI module resources. The ultra-high per-slot bandwidth ensures that high-speed data transmission between modules and the controller is not blocked, which is crucial for high-throughput test tasks such as multi-channel high-frequency signal acquisition. For example, in the production test line of semiconductor components, the chassis can carry PXIe high-speed digitizer modules and PXI relay modules at the same time, realizing rapid data collection and real-time control of test paths. In the laboratory, it can cooperate with PXIe signal processing modules to complete precision measurement tasks such as radar signal analysis and audio frequency response testing.

Installation & Maintenance Pitfalls (Expert Tips)

  1. Module Slot Matching: The chassis has different types of slots with clear functional divisions. The PXIe system timing slot is specially used for timing modules and cannot be inserted into ordinary peripheral modules; the hybrid slots can be compatible with two types of modules, but it is necessary to confirm the module specifications before insertion. Inserting the module into the wrong slot will lead to failure to recognize the module or inability to exert the timing and bandwidth performance.
  2. Power Load Control: The maximum power consumption of the system slot of the chassis shall not exceed 140W, and that of the peripheral slot shall not exceed 38.25W. When configuring high-power modules such as high-voltage output modules, it is necessary to calculate the total power consumption. Exceeding the power limit will trigger the over-current protection of the chassis and cause the system to shut down abnormally.
  3. Static Protection During Maintenance: When replacing the modular power supply shuttle or inserting and removing modules, the chassis components are sensitive to static electricity. It must be operated in a static-free environment and standard static protection measures shall be taken, such as wearing an anti-static wristband. Otherwise, static electricity may damage the internal circuit of the chassis and the module.
  4. Fan and Temperature Management: The fan speed of the chassis can be adjusted automatically. When the ambient temperature exceeds 30°C, the fan speed will increase, and the noise will also rise accordingly. It is necessary to ensure that the air intake at the bottom rear of the chassis is unobstructed. Blocking the air intake will cause poor heat dissipation, and the chassis may reduce power output or shut down to protect itself, affecting the normal operation of the test system.
    NI PXIe-1062Q

    NI PXIe-1062Q

Technical Deep Dive & Overview

The core advantage of the NI PXIe-1062Q lies in its balanced design of compatibility, bandwidth and stability, which meets the diverse needs of modern test systems. Its hybrid slot configuration is a key design for the transition period of PXI to PXIe technology. A large number of PXI modules are still in use in the industry. This design extends the service life of these modules while supporting the high-performance of PXIe modules.
In terms of timing, the dual reference clock design of 10MHz and 100MHz respectively matches the timing requirements of PXI and PXIe modules. The trigger bus and star trigger functions ensure the synchronization accuracy between multiple modules. In multi-channel synchronous acquisition scenarios, this synchronization performance can avoid time deviation between different channel data and ensure the reliability of test results.
The modular power supply is another highlight of its design. For industrial test sites that require 24-hour continuous operation, the power supply can be quickly replaced when it fails, and the replacement time is less than 5 minutes, which greatly reduces the system downtime. However, it should be noted that this power supply shuttle is only compatible with the PXIe-1062Q chassis and cannot be used interchangeably with other NI chassis.
Overall, the NI PXIe-1062Q is a high-performance and versatile chassis that balances compatibility and performance. It is an important part of building a flexible and high-efficiency test system, and is widely recognized in the fields of electronic testing, industrial measurement and laboratory research.