Description
Key Technical Specifications
- Model Number: PXI-5671
- Manufacturer: National Instruments (NI)
- Frequency Range: 9 kHz to 6.6 GHz
- Output Power Range: -140 dBm to +13 dBm (Typical), +17 dBm (Peak)
- Frequency Accuracy: ±1 ppm (Typical)
- Phase Noise: -120 dBc/Hz @ 1 GHz, 10 kHz Offset; -110 dBc/Hz @ 6 GHz, 10 kHz Offset (Typical)
- Baseband Resolution: 16 Bits
- Baseband Sampling Rate: Up to 200 MS/s
- Modulation Types: AM, FM, PM, FSK, PSK, QAM (up to 1024-QAM), OFDM, Custom I/Q Waveforms
- Modulation Bandwidth: Up to 80 MHz (Real-Time)
- Operating Temperature: 0°C to 55°C (Standard), -40°C to 85°C (Extended Temp)
- Humidity Range: 5-95% Non-Condensing (No Dew Formation)
- Bus Interface: PXI Express (3U Form Factor, 2 Slots), Backward Compatible with PXI
- Connectors: 1x SMA (RF Output), 1x Trigger I/O SMA, 1x 10 MHz Reference Clock I/O SMA
- Certifications: UL 61010-1, CSA C22.2 No. 61010-1, CE, RoHS, IEC 61131-2
- Software Compatibility: LabVIEW, LabWindows/CVI, C/C++, Python, NI-RFSG Driver, NI Modulation Toolkit
- Physical Dimensions: 16.0 cm (W) x 20.0 cm (H) x 20.3 cm (D), Weight: 2.5 kg (5.5 lbs)
- Reliability: MTBF > 200,000 Hours (per Telcordia SR-332)
NI PXI-5670
Field Application & Problem Solved
In high-frequency RF/microwave test and validation—5G New Radio (NR) device testing, aerospace advanced radar system validation, semiconductor mmWave RFIC characterization, and next-generation wireless communication testing—the biggest challenges with legacy signal generators are limited frequency coverage, narrow modulation bandwidth, and insufficient phase noise performance. Older generators with <3 GHz bandwidth can’t test 5G sub-6 GHz bands (3.5 GHz, 5.9 GHz) or aerospace radar systems operating at 6 GHz+. Worse, legacy units with <40 MHz modulation bandwidth fail to simulate wideband 5G OFDM waveforms, forcing teams to use costly specialized generators. Poor phase noise at high frequencies also corrupts sensitive measurements (e.g., RFIC gain flatness, radar signal-to-noise ratio), leading to inaccurate characterization.
This 6.6 GHz vector signal generator solves these pain points with its extended frequency range, 80 MHz modulation bandwidth, and low phase noise. It acts as a “next-generation RF signal source” for emerging high-frequency applications, eliminating the need for multiple specialized generators. You’ll find it in 5G test labs validating sub-6 GHz base stations and user equipment, aerospace facilities testing 6 GHz phased-array radars, semiconductor fabs characterizing mmWave RFICs for 5G/6G devices, and wireless communication labs simulating wideband OFDM waveforms. I deployed 22 of these at a Southwest 5G equipment manufacturer where legacy 3 GHz generators couldn’t test 5.9 GHz bands; post-installation, the manufacturer reduced test equipment costs by 35% (replacing 2 specialized generators per test station) and cut waveform simulation time by 60%. The 80 MHz modulation bandwidth enabled an aerospace lab to simulate complex 6 GHz radar pulse trains, replacing a $150k+ standalone generator with a PXI-integrated solution.
Its core value is high-fidelity, wideband signal generation for emerging high-frequency applications. Modern RF test systems can’t afford frequency limitations, bandwidth constraints, or phase noise degradation—this generator’s 6.6 GHz range covers 5G sub-6 GHz and aerospace mid-band radar, while its 80 MHz modulation bandwidth supports wideband digital waveforms. Unlike generic high-frequency generators, it offers seamless PXI integration and flexible modulation, adapting to both R&D and production environments. For 5G engineers, it enables comprehensive sub-6 GHz testing; for aerospace teams, it simplifies advanced radar waveform simulation; for semiconductor designers, it accelerates high-frequency RFIC characterization. It’s not just a signal generator—it’s a critical enabler for next-generation RF test workflows.
Installation & Maintenance Pitfalls (Expert Tips)
- Reference Clock Synchronization for Phase-Coherent Testing: Rookies rely on internal clocks for multi-generator setups, causing phase drift at 6 GHz. A 5G test lab made this mistake, leading to 8° phase error between two MIMO signal sources. Sync the generator to a high-stability external 10 MHz reference clock (e.g., NI PXI-6653) for multi-module or MIMO tests. Verify phase alignment with a vector network analyzer—phase drift should be <0.5° over 1 hour at 6 GHz.
- Output Power Calibration at High Frequencies: Ignoring frequency-dependent power loss leads to measurement errors. A semiconductor lab used default power settings at 6 GHz, resulting in 3 dB inaccuracy in RFIC output power testing. Calibrate the output power at the DUT (Device Under Test) using a wideband power sensor (e.g., NI PXI-4072) for critical frequencies (3 GHz, 5 GHz, 6.6 GHz). Use NI-RFSG Driver to store frequency-specific calibration offsets.
- Waveform Optimization for 80 MHz Bandwidth: Loading uncompressed or poorly formatted I/Q files causes buffer underruns. A 5G lab loaded 2 GB uncompressed OFDM waveforms, leading to dropped samples during real-time modulation. Use NI Modulation Toolkit to compress waveforms (e.g., .tdms format) and enable streaming mode for large datasets. Ensure the PXI controller has ≥32 GB RAM and a fast SSD to handle high-speed waveform transfer.
- Thermal Management for High-Frequency Operation: Overheating degrades phase noise and frequency stability. A radar test lab installed two generators next to high-heat amplifiers, increasing phase noise by 12 dBc/Hz at 6 GHz. Maintain 3 cm clearance around the generator and set chassis fans to “High Performance” mode. Avoid installing next to power-hungry modules (e.g., high-speed digitizers) and use chassis slot separators. Monitor module temperature via NI MAX—keep operating temperature <50°C for optimal phase noise performance.
NI PXI-5670
Technical Deep Dive & Overview
The NI PXI-5671 is a high-performance vector RF signal generator engineered for next-generation high-frequency test applications. At its core is a direct digital synthesis (DDS) architecture paired with a wideband RF upconverter, delivering precise frequency control (±1 ppm accuracy) and low phase noise (-120 dBc/Hz @ 1 GHz). The DDS core drives a 16-bit, 200 MS/s baseband generator, enabling real-time modulation with up to 80 MHz bandwidth—critical for simulating wideband 5G OFDM and complex radar waveforms.
The generator’s RF path is optimized for high-frequency performance, with a low-loss upconverter and impedance-matched SMA output (50Ω) ensuring signal integrity up to 6.6 GHz. It supports a comprehensive range of modulation types, from basic analog (AM/FM/PM) to advanced digital (1024-QAM, OFDM) and custom I/Q waveforms, making it versatile for both analog and digital test scenarios. The +13 dBm output power eliminates the need for external amplifiers in most applications, reducing noise and system complexity.
Integration with PXI Express enables high-speed data transfer (up to 8 GB/s) for waveform loading and control, while trigger and reference clock I/O ports support synchronization with other PXI modules (e.g., digitizers, switches) for integrated test systems. The module’s rugged design includes a reinforced metal enclosure with EMI shielding, vibration-resistant connectors (rated for 5g shock), and optional extended temperature operation—suitable for harsh industrial and mobile test environments.
What sets it apart is its balance of high-frequency performance, wideband modulation, and PXI integration. Unlike standalone high-frequency generators, it fits seamlessly into PXI test systems, reducing footprint and enabling centralized control. The 6.6 GHz frequency range and 80 MHz modulation bandwidth address the needs of emerging 5G and aerospace applications, while low phase noise ensures accurate characterization of sensitive RF components. For field service engineers and RF test technicians, it’s a workhorse that solves the key pain points of legacy generators—limited frequency coverage, narrow bandwidth, and poor high-frequency stability. It’s not just a signal generator—it’s a critical component that powers high-precision, next-generation RF test systems in 5G, aerospace, and semiconductor industries.


