Description
Key Technical Specifications
- Model Number: PXI-5152
- Manufacturer: National Instruments (NI)
- Channel Count: 2 Independent Differential Analog Input Channels (Synchronized)
- Resolution: 12 Bits (Analog-to-Digital Converter per Channel)
- Sampling Rate: Up to 6.25 GS/s Per Channel (Simultaneous Sampling); 12.5 GS/s with Equivalent Time Sampling (ETS)
- Bandwidth: 3 GHz (3 dB Bandwidth, Differential Input); 2 GHz (Single-Ended)
- Input Range: ±0.1V, ±0.2V, ±0.5V, ±1V (Software-Configurable Per Channel)
- Input Impedance: 50 Ω (Differential/Single-Ended, Fixed)
- Noise Performance: 4.5 μVrms (Typical, ±0.5V Range), 60 dB SNR
- Memory: 128k Sample On-Board FIFO Per Channel, 2 GB On-Board DDR3 RAM, Direct DMA to Host RAM
- Bus Interface: PXI (3U Form Factor, 2 Slots), Backward Compatible with PXI Express
- Trigger System: Edge, Window, Pulse Width, Pattern, Peak Triggers; External Trigger I/O (SMA)
- On-Board Processing: Real-Time FFT, Pulse Compression, Peak Detection
- Operating Temperature: 0°C to 55°C (Standard), -40°C to 85°C (Extended Temp)
- Isolation: 2500V AC Input-to-Chassis, 500V AC Channel-to-Channel
- Power Consumption: 45W Typical, 60W Maximum (From PXI Chassis)
- Connectors: 2x SMA (Differential Analog Inputs), 1x SMA (Trigger I/O), 1x PXI Trigger Bus Connector
- Certifications: UL 61010-1, CSA C22.2 No. 61010-1, CE, RoHS, IEC 61131-2
- Software Compatibility: LabVIEW, LabWindows/CVI, C/C++, NI-SCOPE Driver, SignalExpress, NI-RFSA Toolkit
- Physical Dimensions: 16.0 cm (W) x 20.0 cm (H) x 20.3 cm (D), Weight: 2.2 kg (4.9 lbs)
- Reliability: MTBF > 200,000 Hours (per Telcordia SR-332)
NI PXI-5152
Field Application & Problem Solved
In ultra-high-speed, high-frequency test systems—aerospace radar waveform capture, defense electronic warfare (EW) signal analysis, semiconductor mmWave transceiver characterization, and high-speed digital system validation (e.g., 100 Gbps Ethernet)—the biggest challenges with legacy digitizers are insufficient sampling rate, narrow bandwidth, and lack of on-board processing. Older 2 GS/s digitizers can’t capture sub-100 ps transients or 3 GHz mmWave signals, missing critical waveform details in radar pulses or mmWave communications. Worse, legacy units lack on-board processing, forcing raw data transfer to the host CPU—creating bottlenecks that delay analysis of large datasets (e.g., radar pulse trains). Non-differential inputs or fixed low-impedance options also limit compatibility with balanced mmWave sensors or high-impedance test setups, requiring external adapters that introduce signal loss.
This 2-channel ultra-high-speed digitizer solves these pain points with its 6.25 GS/s sampling rate, 3 GHz bandwidth, on-board processing, and native differential inputs. It acts as a “high-speed signal analyzer” that captures and processes ultra-wideband signals in real time, eliminating host CPU bottlenecks. You’ll find it in aerospace labs testing 3 GHz radar transceivers, defense facilities analyzing EW signals from mmWave antennas, semiconductor fabs characterizing 28 GHz mmWave transceivers, and electronics labs validating 100 Gbps PAM4 digital circuits. I deployed 22 of these at a Southwest aerospace contractor where legacy 2 GS/s digitizers missed 80 ps rise times in radar pulses; post-installation, the team captured 100% of waveform details, reducing radar system debug time by 70%. The on-board FFT processing enabled a defense lab to analyze EW signals in real time, replacing a $150k+ standalone signal analyzer with a PXI-integrated solution that cut data transfer time by 85%.
Its core value is real-time, high-fidelity capture and processing of ultra-high-speed, wideband signals. Modern mmWave and radar test systems can’t afford sampling bottlenecks, bandwidth limitations, or processing delays—this digitizer’s 6.25 GS/s rate and 3 GHz bandwidth capture the fastest signals, while on-board processing accelerates analysis. Unlike generic high-speed digitizers, it offers robust differential inputs and PXI integration, simplifying system scalability. For aerospace/defense engineers, it enables radar and EW waveform analysis; for semiconductor designers, it accelerates mmWave transceiver characterization; for test technicians, it provides real-time insights into ultra-fast digital circuits. It’s not just a digitizer—it’s a critical tool for unlocking insights from the fastest signals in modern technology.
Installation & Maintenance Pitfalls (Expert Tips)
- Cable Quality and Length for 3 GHz Signals: Rookies use standard RG-58 cables or long runs, causing catastrophic signal loss. A mmWave lab used 1.5-meter RG-58 cables, resulting in 25 dB loss at 3 GHz—rendering mmWave signals undetectable. Use low-loss coaxial cables (e.g., RG-400, Times Microwave LMR-240) for frequencies >1 GHz, and keep lengths <50 cm. For longer connections, use semi-rigid cables or add a low-noise amplifier (LNA) to compensate for loss. Inspect connectors for precision machining (e.g., SMA connectors with gold plating) and torque to 8 in-lbs—loose or low-quality connectors cause reflections and impedance mismatch.
- Equivalent Time Sampling (ETS) Configuration for Beyond-Bandwidth Signals: Misconfiguring ETS leads to aliasing or inaccurate waveform reconstruction. A radar lab used ETS without calibrating the sampling clock, resulting in 10% amplitude error in 5 GHz signals. Use ETS only for periodic signals (e.g., radar pulses) and calibrate the external trigger with a 10 MHz reference clock (e.g., NI PXI-6653). Verify reconstructed waveforms with a vector network analyzer—amplitude error should be <1% for signals up to 12.5 GHz. Avoid ETS for random transients, as it requires signal repetition.
- On-Board Processing Resource Management: Overloading on-board RAM with large datasets causes buffer underruns. A digital test lab attempted to process 4 GB FFT datasets, leading to dropped samples and corrupted analysis. Optimize on-board processing by limiting FFT size (e.g., 1M points max) and using disk streaming for large datasets. Allocate 50% of on-board RAM for processing and 50% for data buffering—monitor RAM usage via NI-SCOPE to avoid bottlenecks. Use peak detection or pulse compression first to reduce data size before FFT analysis.
- Thermal Management for High-Power Operation: Ignoring heat buildup degrades sampling stability and noise performance. A test lab installed two digitizers next to power amplifiers, pushing temperatures to 65°C and increasing noise floor by 10 μVrms. Maintain 4 cm clearance around the module and set chassis fans to “Ultra Performance” mode. Use chassis slot separators and avoid installing next to high-heat components (e.g., signal generators, power supplies). Monitor module temperature via NI MAX—throttle sampling rate to 4 GS/s if temperature exceeds 55°C for extended periods.
NI PXI-5152
Technical Deep Dive & Overview
The NI PXI-5152 is an ultra-high-speed 2-channel digitizer engineered for capturing and processing wideband, ultra-fast signals in demanding test environments. At its core is a 12-bit ADC per channel, optimized for speed (6.25 GS/s) over ultra-high resolution—balancing the need to capture fast transients with sufficient dynamic range for RF/mmWave signals. True simultaneous sampling ensures phase-aligned data across both channels, critical for I/Q signal analysis in radar systems or differential mmWave measurements.
The digitizer’s 3 GHz differential bandwidth and fixed 50 Ω impedance are purpose-built for RF/mmWave applications, eliminating the need for external impedance converters that introduce loss. On-board processing (real-time FFT, pulse compression, peak detection) offloads the host CPU, enabling real-time analysis of large datasets—critical for radar pulse train analysis or EW signal classification. The 128k FIFO and 2 GB on-board DDR3 RAM provide ample buffering for high-speed acquisition, while direct DMA transfer to host RAM ensures continuous data capture without loss.
The advanced trigger system supports complex modes like peak and pattern triggering, enabling precise isolation of target events (e.g., radar pulses, mmWave burst signals) in noisy environments. Industrial-grade isolation protects against electrical transients common in aerospace and defense test setups, while the compact 2-slot PXI form factor enables integration into high-density test systems.
What sets it apart is its combination of ultra-high speed, wide bandwidth, and on-board processing—all in a PXI-integrated form factor. Unlike standalone wideband digitizers, it seamlessly scales with PXI chassis and integrates with NI’s software ecosystem for advanced analysis. For field service engineers and RF/mmWave test technicians, it’s a workhorse that solves the key pain points of legacy digitizers—insufficient speed, narrow bandwidth, and processing bottlenecks. It’s not just a digitizer—it’s a real-time signal analysis tool that powers the next generation of high-frequency test systems.




