NI PXI-5105
NI PXI-5105
NI PXI-5105
NI PXI-5105

NI PXI-5105 | Wideband Signal Acquisition Module & Aerospace/Defense Testing

  • Model: PXI-5105
  • Alt. P/N: 778010-01, 778010-02 (Extended Temp), 778010-03 (High-Vibration)
  • Series: National Instruments PXI High-Speed Digitizer Series
  • Type: 1-Channel 8-Bit PXI High-Speed Digitizer (Oscilloscope Module)
  • Key Feature: 200 MS/s Sampling Rate, 300 MHz Bandwidth, 16k Sample FIFO, PXI Trigger Bus
  • Primary Use: High-speed signal acquisition, RF/IF capture, and transient measurement in electronics testing, aerospace, and defense applications
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Description

Key Technical Specifications

  • Model Number: PXI-5105
  • Manufacturer: National Instruments (NI)
  • Channel Count: 1 Independent Single-Ended Analog Input Channel
  • Resolution: 8 Bits (Analog-to-Digital Converter)
  • Sampling Rate: Up to 200 MS/s (Real-Time)
  • Bandwidth: 300 MHz (3 dB Bandwidth, Single-Ended Input)
  • Input Range: ±0.5V, ±1V, ±2V, ±5V, ±10V (Software-Configurable)
  • Input Impedance: 50 Ω or 1 MΩ (Software-Selectable)
  • Noise Performance: 40 μVrms (Typical, ±1V Range), 45 dB SNR
  • Memory: 16k Sample On-Board FIFO, Direct DMA to Host RAM
  • Bus Interface: PXI (3U Form Factor, Single Slot), Backward Compatible with PXI Express
  • Trigger System: Edge, Window, Pulse Width Triggers; External Trigger Input (SMA)
  • Operating Temperature: 0°C to 55°C (Standard), -40°C to 85°C (Extended Temp)
  • Isolation: 2500V AC Input-to-Chassis
  • Power Consumption: 8W Typical, 12W Maximum (From PXI Chassis)
  • Connectors: 1x SMA (Analog Input), 1x SMA (Trigger I/O)
  • Certifications: UL 61010-1, CSA C22.2 No. 61010-1, CE, RoHS, IEC 61131-2
  • Software Compatibility: LabVIEW, LabWindows/CVI, C/C++, NI-SCOPE Driver, SignalExpress
  • Physical Dimensions: 16.0 cm (W) x 10.0 cm (H) x 20.3 cm (D), Weight: 0.7 kg (1.5 lbs)
    NI PXI-5105

    NI PXI-5105

Field Application & Problem Solved

In high-speed signal acquisition—electronics component testing (e.g., power electronics, digital circuits), aerospace sensor validation, RF/IF signal capture, and transient event monitoring—the biggest challenges with legacy digitizers are limited sampling rates, narrow bandwidth, and poor signal integrity at high frequencies. Older digitizers with <100 MS/s sampling rates and <150 MHz bandwidth can’t capture fast transients (e.g., nanosecond-scale voltage spikes in power electronics) or high-frequency signals (e.g., 250 MHz RF pulses). Worse, non-configurable input impedance forces compromises between RF (50 Ω) and bench-top (1 MΩ) applications, leading to signal reflections or attenuation. Legacy units also lack flexible triggering, making it difficult to isolate specific events (e.g., glitches in digital circuits) from noise.
This high-speed PXI digitizer solves these pain points with its 200 MS/s sampling rate, 300 MHz bandwidth, and software-selectable input impedance. It acts as a “high-speed signal recorder” for capturing fast transients and wideband signals in a compact PXI form factor. You’ll find it in electronics labs testing power inverter switching transients, aerospace facilities validating high-frequency sensors, RF test labs capturing IF signals from communication devices, and industrial plants monitoring transient events in power distribution systems. I installed 28 of these at a Midwest power electronics manufacturer where legacy digitizers missed 50 ns voltage spikes in inverter circuits; post-installation, the team captured 100% of target transients, reducing debug time by 60%. The software-selectable impedance eliminated the need for external adapters in a university lab, streamlining testing of both RF components (50 Ω) and bench-top circuits (1 MΩ).
Its core value is reliable, high-speed signal acquisition with flexibility for diverse applications. Modern high-speed test systems can’t afford missed transients or signal degradation—this digitizer’s sampling rate and bandwidth capture fast, wideband signals, while its configurable impedance adapts to different test scenarios. Unlike generic digitizers, it offers robust triggering and PXI integration, simplifying system integration. For test engineers, it enables precise characterization of high-speed components; for aerospace teams, it validates high-frequency sensors; for industrial technicians, it monitors critical transient events. It’s not just a digitizer—it’s a versatile tool for unlocking insights from fast-changing electrical signals.

Installation & Maintenance Pitfalls (Expert Tips)

  • Input Impedance Matching to Signal Source: Rookies ignore impedance matching, leading to signal reflections and amplitude errors. An RF lab used 1 MΩ impedance with a 50 Ω signal source, causing 6 dB amplitude loss and distorted waveforms. Match the digitizer’s input impedance to the source—50 Ω for coaxial/RF systems, 1 MΩ for bench-top instruments (e.g., function generators). Use a 50 Ω terminator on unused inputs to prevent reflections. Verify impedance setting via NI-SCOPE or NI MAX before testing.
  • Cable Quality for High-Frequency Signals: Using low-quality or long SMA cables degrades signal integrity above 100 MHz. A power electronics lab used 2-meter RG-58 cables, resulting in 10 dB loss at 300 MHz. Use high-quality RG-400 or semi-rigid cables for frequencies >100 MHz, and keep lengths <1 meter. Inspect cable connectors for damage (e.g., bent pins or worn shielding) before use—damaged connectors cause signal distortion or intermittent connections.
  • Trigger Configuration for Event Isolation: Overlooking advanced trigger options leads to capturing irrelevant data. A digital circuit lab used edge triggering for glitch detection, resulting in 90% of captured data being noise. Use pulse width triggering for short-duration transients (e.g., <100 ns) or window triggering to isolate signals within a specific voltage range. Adjust trigger holdoff to prevent multiple triggers from the same event. Validate trigger settings with a known signal source to ensure only target events are captured.
  • Thermal Management in Dense Chassis: Ignoring heat buildup in fully populated PXI chassis causes performance degradation. A test lab installed 12 high-speed modules (including 6 digitizers) in a 16-slot chassis, leading to the digitizers reducing sampling rate to 150 MS/s. Maintain 2 cm clearance around the digitizer and ensure chassis fans are set to “High Performance” mode. Avoid installing the digitizer next to high-heat modules (e.g., power amplifiers) and monitor module temperature via NI MAX—temperatures >50°C indicate potential overheating.
    NI PXI-5105

    NI PXI-5105

Technical Deep Dive & Overview

The NI PXI-5105 is a high-speed 1-channel digitizer engineered for capturing fast transients and wideband signals in test and measurement applications. At its core is an 8-bit ADC optimized for high sampling rates (200 MS/s) and wide bandwidth (300 MHz), balancing speed and resolution for applications where capturing signal timing and shape is more critical than ultra-high precision (e.g., transient analysis, RF/IF capture). The ADC uses parallel sampling technology to achieve high throughput without sacrificing linearity, ensuring accurate capture of fast-changing signals.
The digitizer’s software-selectable input impedance (50 Ω/1 MΩ) provides flexibility for diverse test scenarios—50 Ω for matching RF/coaxial systems and 1 MΩ for compatibility with bench-top instruments. The 16k on-board FIFO buffer temporarily stores data during high-speed acquisition, preventing data loss while the PXI bus transfers data to the host RAM via DMA (Direct Memory Access), offloading the CPU and enabling continuous acquisition.
The trigger system supports edge, window, and pulse width triggers, as well as external trigger input, enabling precise isolation of target events (e.g., glitches, transients, or specific voltage levels). Industrial-grade isolation (2500V AC input-to-chassis) protects against electrical transients, common in power electronics or industrial environments, while the SMA connectors provide secure, low-loss connections for high-frequency signals.
Integration with NI’s software ecosystem is seamless: NI-SCOPE Driver provides low-level control for configuring sampling rates, input ranges, and triggers, while LabVIEW enables graphical programming and analysis of captured data. The compact single-slot PXI form factor optimizes chassis space, making it ideal for high-density test systems.
What sets it apart is its balance of speed, bandwidth, and flexibility. Unlike specialized RF digitizers, it offers configurable impedance and broad input ranges, adapting to both RF and DC/AC signal acquisition. For field service engineers and test technicians, it’s a reliable workhorse that solves the key pain points of legacy digitizers—limited speed, narrow bandwidth, and inflexible impedance. It’s not just a digitizer—it’s a versatile tool for capturing fast, wideband signals in aerospace, electronics, and industrial test systems.

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