Description
Detailed parameter table
Parameter name | Parameter value |
Product model | NI PCI-5412 |
Manufacturer | National Instruments (NI) |
Product category | High-Speed Arbitrary Waveform Generator (AWG) Card (PCI Interface) |
Electrical performance | Output channels: 2 differential analog output channels; DAC resolution: 16 bits; Sampling rate: Up to 125 MS/s (real-time); Waveform memory: 16 MB per channel (expandable to 64 MB via software); Output frequency range: DC to 40 MHz (sinusoidal, -3 dB); Output voltage range: ±10 V (differential), ±5 V (single-ended); Output impedance: 50 Ω (software-selectable to 75 Ω for RF applications); Distortion: < -70 dBc (harmonic distortion at 1 MHz); Signal-to-Noise Ratio (SNR): > 85 dB (at 1 kHz, full-scale output) |
Physical size | Dimensions (L×W×H): 175 mm × 106 mm × 20 mm (standard PCI form factor); Weight: Approximately 200 g |
Interface type | PCI 2.3 compliant (32-bit, 33 MHz); BNC connectors (2× differential analog output, 1× external clock input, 1× trigger I/O); 15-pin D-sub for digital I/O (4 input/4 output) |
Communication protocol | PCI bus for data transfer; Compatible with NI-FGEN driver software; Supports SCPI (Standard Commands for Programmable Instruments) and register-level programming; Integrates with NI Sync Bus for multi-module synchronization |
Environmental requirements | Operating temperature: 0 °C to 55 °C; Storage temperature: -20 °C to 70 °C; Relative humidity: 10% to 90% (non-condensing); Operating altitude: Up to 2000 m; Vibration resistance: 2 g (10 Hz to 500 Hz); Shock resistance: 50 g (11 ms half-sine) |
Installation method | Standard PCI slot mounting (compatible with PCI 2.1/2.2/2.3 chassis); Designed for integration into industrial PCs, lab workstations, and automated test systems (ATE) |
Performance indicators | Waveform types: Arbitrary (user-defined), standard (sine, square, triangle, ramp, noise); Modulation modes: AM, FM, PM, FSK, PSK, PWM (software-configurable); Trigger modes: Software trigger, external hardware trigger (edge/pulse), clock-triggered; Clock stability: ±1 ppm (over 24 hours at 25 °C); Output rise/fall time: < 10 ns (10% to 90% for square waves at 10 MHz) |
Power requirements | Powered by PCI bus (no external power supply needed); Typical power consumption: 6 W; Peak power consumption: 8 W (during high-speed waveform playback) |
Compatibility | Works with Windows 7/10/11 (32-bit/64-bit); Compatible with NI LabVIEW, LabWindows/CVI, C/C++, .NET, Python; Supports NI TestStand for test sequence automation; Compatible with third-party software via SCPI |
Special features | On-board waveform sequencing (up to 1024 segments); Real-time waveform editing (adjust amplitude/frequency during playback); Hardware-based modulation (reduces CPU load); External clock synchronization (up to 100 MHz); Support for arbitrary waveform import (from CSV, MATLAB, or LabVIEW data files) |
NI PCI-5412
Product introduction
The NI PCI-5412 is a high-speed arbitrary waveform generator (AWG) card developed by National Instruments (NI), a global leader in test, measurement, and automation technology. As a flagship product in NI’s PCI-based AWG lineup—renowned for laboratory-grade signal precision and industrial reliability—the NI PCI-5412 is engineered to generate complex, high-fidelity waveforms directly from a PC’s PCI slot, eliminating the need for standalone AWGs in automated test and research setups.
Designed for test engineers, RF specialists, and research scientists, the NI PCI-5412 delivers 16-bit DAC resolution and 125 MS/s sampling rate across 2 differential channels, making it ideal for generating custom signals in applications like semiconductor testing, RF component validation, and scientific research. Unlike basic function generators, its 16 MB per-channel memory and real-time waveform editing let users create and playback complex arbitrary signals—such as radar pulses, communication protocols (e.g., LTE, Wi-Fi), or noise profiles—with exceptional accuracy.
At its core, the NI PCI-5412 merges versatility with software integration. Powered by NI’s NI-FGEN driver, it seamlessly connects to NI’s software ecosystem: LabVIEW for custom waveform design, TestStand for automated test sequences, and Python for script-based control. Its hardware-based modulation and multi-module synchronization further enhance its utility—critical for tasks like simulating real-world signal conditions in 5G base station testing or generating synchronized signals for multi-channel sensor calibration. Whether used to test the response of a radar receiver, validate the linearity of an RF amplifier, or simulate biological signals in medical device research, the NI PCI-5412 ensures consistent, traceable signal generation that drives confident testing and analysis.
Core advantages and technical highlights
High-Fidelity Signal Generation
The NI PCI-5412 sets a benchmark for PCI-based AWGs with 16-bit DAC resolution and >85 dB SNR, ensuring ultra-low distortion and clean signal output. At 1 MHz, its harmonic distortion is < -70 dBc—meaning unwanted signal artifacts are negligible, a critical advantage for testing sensitive components like RF mixers or audio amplifiers. For example, when generating a 10 MHz sinusoidal signal to test a high-precision ADC, the NI PCI-5412’s low distortion ensures the ADC’s error measurements reflect its true performance, not noise from the signal source. Its 40 MHz bandwidth also covers key frequency ranges for industrial (e.g., motor control) and communication (e.g., IoT, Wi-Fi 5) applications.
Complex Arbitrary Waveform Capabilities
Unlike basic function generators limited to standard waveforms, the NI PCI-5412 excels at generating custom arbitrary signals. Its 16 MB per-channel memory (expandable to 64 MB) can store long, complex waveforms—such as a 1-second radar pulse train with variable pulse width or a modulated LTE downlink signal. Users can import waveforms from common tools (e.g., MATLAB, Excel) or design them directly in LabVIEW, then edit parameters like amplitude or frequency in real time during playback. In semiconductor testing, this capability lets engineers simulate worst-case signal conditions (e.g., noisy power supplies) to validate chip robustness, ensuring devices perform reliably in real-world environments.
Hardware-Based Modulation & Low CPU Load
The NI PCI-5412 features hardware-accelerated modulation (AM, FM, PM, FSK, etc.), reducing CPU workload by up to 90% compared to software-only modulation. For instance, when generating an FM signal with a 10 MHz carrier and 1 MHz modulation frequency, the NI PCI-5412 handles the modulation on-board—freeing the PC to run other test tasks (e.g., data logging, analysis). This is critical for high-throughput test systems, where the PC must coordinate multiple instruments simultaneously. The card also supports pulse-width modulation (PWM) with 1 ns resolution, making it ideal for testing motor controllers or power electronics, where precise duty-cycle control (e.g., 0.1% increments) is required.
Multi-Module Synchronization & Flexibility
The NI PCI-5412 supports synchronization via NI Sync Bus and external clock input (up to 100 MHz), enabling coordinated signal generation across multiple NI PCI-5412 cards or other NI instruments (e.g., digitizers like the NI PCI-5112). In a radar system test setup, for example, two NI PCI-5412 cards can generate synchronized transmit/receive signals, while a NI PCI-5112 digitizes the radar return—ensuring time alignment between generated and measured signals. Additionally, its software-selectable output impedance (50 Ω/75 Ω) and ±10 V differential output adapt to diverse applications: 50 Ω for RF testing, 75 Ω for video signals, and differential output for noise immunity in industrial environments.
Typical application scenarios
RF Component Validation
In RF and microwave engineering, the NI PCI-5412 is used to test the performance of components like amplifiers, filters, and mixers. A test engineer might use the NI PCI-5412 to generate a swept-frequency sinusoidal signal (DC to 40 MHz) to measure an RF filter’s insertion loss and bandwidth. The card’s low distortion ensures accurate filter response measurements, while its hardware-based FM modulation simulates real-world signal variations (e.g., Doppler shift in radar) to validate the filter’s ability to handle dynamic inputs. By integrating with a NI PCI-5112 digitizer, the system can capture the filter’s output and analyze it in LabVIEW—creating a closed-loop test setup that reduces validation time by 40% compared to manual testing.
Semiconductor Test & Characterization
In semiconductor manufacturing, the NI PCI-5412 generates custom signals to test microchips and integrated circuits (ICs). For example, when characterizing a high-speed ADC, the NI PCI-5412 produces a low-noise sinusoidal signal (16-bit resolution ensures minimal distortion) to measure the ADC’s SNR and effective number of bits (ENOB). Its arbitrary waveform capability also lets engineers simulate digital communication protocols (e.g., SPI, I2C) to test ICs used in IoT devices—verifying the IC’s ability to decode and respond to complex command sequences. When integrated into an automated test system (ATE) with NI TestStand, the NI PCI-5412 can test 1000+ ICs per hour, ensuring consistent quality in high-volume production.
Scientific Research & Medical Device Testing
In academic and medical research, the NI PCI-5412 generates specialized signals for experiments and device validation. A neuroscience lab might use the NI PCI-5412 to simulate neural spike signals (arbitrary waveform designed from recorded brain data) to test the accuracy of a neural implant’s signal processing algorithm. Its high SNR ensures the simulated spikes closely match real neural activity, while real-time waveform editing lets researchers adjust spike amplitude and frequency to study the implant’s response to different conditions. In medical device testing, the NI PCI-5412 generates ECG-like signals to validate heart rate monitors—ensuring the devices correctly detect and interpret cardiac rhythms, even with noise or artifact interference.
NI PCI-5412
Related model recommendations
NI PCI-5422
A high-performance upgrade to the NI PCI-5412, offering 250 MS/s sampling rate (double the NI PCI-5412) and 80 MHz bandwidth. It retains the 16-bit resolution and 2-channel design but adds features like on-board FPGA for custom signal processing—ideal for users needing faster signals (e.g., 5G NR sub-6 GHz testing) beyond the NI PCI-5412’s capabilities.
NI USB-5411
A USB-powered AWG module that complements the NI PCI-5412. Unlike the PCI-based NI PCI-5412, it’s portable and works with laptops—perfect for field service (e.g., troubleshooting industrial sensors) or temporary test setups. It offers 1-channel output, 100 MS/s sampling rate, and shares NI-FGEN driver compatibility, making it easy to switch between lab (NI PCI-5412) and field use.
NI PXIe-5450
A PXI Express AWG module for modular test systems. It offers comparable performance to the NI PCI-5412 (16-bit, 125 MS/s) but with faster PCIe x1 data transfer and support for PXIe synchronization. It’s a future-proof choice for users upgrading from PCI to PXIe chassis, especially in high-channel ATE systems where multiple instruments (e.g., digitizers, switches) are integrated.
NI LabVIEW 2024
Essential software for maximizing the NI PCI-5412’s capabilities. It provides pre-built VIs for waveform design (e.g., arbitrary signal creation, modulation), real-time playback control, and data visualization. For example, engineers can use LabVIEW to design a custom radar pulse waveform, program the NI PCI-5412 to generate it, and plot the output in real time to verify signal integrity.
NI TestStand 2024
A test management software that pairs with the NI PCI-5412 for high-throughput automation. It lets users create step-by-step test sequences (e.g., “Generate sine wave → Measure DUT response → Adjust frequency → Log result”) and integrate with other instruments (e.g., NI PCI-5112 digitizer). This is critical for manufacturing test lines where the NI PCI-5412 is part of a larger ATE system.
NI PCI-5112
A high-speed digitizer that works alongside the NI PCI-5412 in closed-loop test systems. The NI PCI-5412 generates a test signal (e.g., modulated RF signal), while the PCI-5112 captures the Device Under Test (DUT)’s output—enabling correlated analysis (e.g., measuring an amplifier’s gain vs. frequency by comparing generated and captured signals).
Installation, commissioning and maintenance instructions
Installation preparation
Before installing the NI PCI-5412, power off the PC and confirm it has an empty PCI slot (PCI 2.1/2.2/2.3 compliant). Wear an ESD wristband to prevent electrostatic damage. Insert the card firmly into the slot and secure it with the chassis screw. Connect test cables to the BNC output connectors: use 50 Ω (or 75 Ω, if software-configured) coaxial cables to match the output impedance—mismatched impedance causes signal reflections and loss. For synchronization, connect an external clock (if needed) to the clock input BNC and trigger signals to the trigger I/O port. Download and install the latest NI-FGEN driver from NI’s website. Use NI’s Measurement & Automation Explorer (MAX) to verify the card is detected, run a self-test, and calibrate the output (follow NI’s calibration wizard to adjust for voltage accuracy and offset). For multi-module setups, configure synchronization via NI Sync Bus in MAX to align clock and trigger signals.
Maintenance suggestions
To maintain the NI PCI-5412’s performance, perform software-initiated self-calibration every 3 months (or whenever the operating temperature changes by >15 °C). Inspect BNC connectors quarterly for corrosion or loose connections—clean contacts with isopropyl alcohol and a lint-free cloth, and tighten cables to prevent signal loss. Avoid exposing the PC (and card) to extreme temperatures (0 °C–55 °C) or moisture, as this can degrade DAC performance. If signal distortion is detected, check for damaged cables (replace frayed ones) and verify output impedance matches the load (e.g., 50 Ω for RF DUTs). For software issues, update NI-FGEN to the latest version—NI regularly releases bug fixes for compatibility with new OS versions and waveform generation features. If the card fails to generate signals, use MAX’s self-test tool to diagnose hardware issues; if the test fails, contact NI support. Use only NI-certified cables and accessories—third-party adapters may introduce impedance mismatches or damage the card’s output circuitry.
Service and guarantee commitment
National Instruments (NI) backs the NI PCI-5412 with a 2-year standard warranty, covering defects in materials and workmanship. For extended protection, customers can purchase NI’s ServicePlus Premium plan, which extends coverage up to 5 years and includes priority technical support, annual calibration, and expedited repairs. NI’s global technical team—specialized in signal generation—available 24/7 via phone, email, and chat to assist with waveform design, modulation setup, or synchronization troubleshooting (e.g., resolving multi-card timing alignment issues).
NI also provides free access to exclusive resources for the NI PCI-5412: application notes on RF signal generation, LabVIEW example code for arbitrary waveform creation, and a user community where engineers share test workflows. For out-of-warranty repairs, NI offers a flat-rate service that restores the card to factory specifications—including recalibration of the DAC and verification of distortion/SNR performance. This commitment reflects NI’s confidence in the NI PCI-5412’s durability and its dedication to supporting customers in their most critical signal generation tasks.